Zhiteng Chao

Orcid: 0009-0006-2926-7499

According to our database1, Zhiteng Chao authored at least 13 papers between 2020 and 2025.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2025
Memory-Efficient and Adaptive Heterogeneous Framework for Gate-Level Fault Simulation.
ACM Trans. Design Autom. Electr. Syst., September, 2025

AssertFix: Empowering Automated Assertion Fix via Large Language Models.
CoRR, September, 2025

AssertGen: Enhancement of LLM-aided Assertion Generation through Cross-Layer Signal Bridging.
CoRR, September, 2025

DeepAssert: An LLM-Aided Verification Framework with Fine-Grained Assertion Generation for Modules with Extracted Module Specifications.
CoRR, September, 2025

Extend IVerilog to Support Batch RTL Fault Simulation.
CoRR, May, 2025

A fast test compaction method using dedicated Pure MaxSAT solver embedded in DFT flow.
Integr., 2025

HighTPI: A Hierarchical Graph Based Intelligent Method for Test Point Insertion.
Proceedings of the 43rd IEEE VLSI Test Symposium, 2025

MOSS: Multi-Modal Representation Learning on Sequential Circuits.
Proceedings of the 62nd ACM/IEEE Design Automation Conference, 2025

PastATPG: A Hybrid ATPG Framework for Better Test Compaction with Partial Assignment SAT.
Proceedings of the 62nd ACM/IEEE Design Automation Conference, 2025

2024
A Static Test Compaction Method Based on GCN Assisted Fault Gate Classification.
Proceedings of the IEEE International Test Conference in Asia, 2024

A Fast Test Compaction Method for Commercial DFT Flow Using Dedicated Pure-MaxSAT Solver.
Proceedings of the 29th Asia and South Pacific Design Automation Conference, 2024

2023
A Distributed ATPG System Combining Test Compaction Based on Pure MaxSAT.
Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2020
Optimization Space Exploration of Hardware Design for CRYSTALS-KYBER.
Proceedings of the 29th IEEE Asian Test Symposium, 2020


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