Aiman H. El-Maleh

Orcid: 0000-0002-3247-0598

Affiliations:
  • King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia


According to our database1, Aiman H. El-Maleh authored at least 62 papers between 1992 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
Optimization of FPGA-based CNN accelerators using metaheuristics.
J. Supercomput., March, 2023

2022
DE-ZFP: An FPGA implementation of a modified ZFP compression/decompression algorithm.
Microprocess. Microsystems, April, 2022

FxP-QNet: A Post-Training Quantizer for the Design of Mixed Low-Precision DNNs With Dynamic Fixed-Point Representation.
IEEE Access, 2022

2021
Time redundancy and gate sizing soft error-tolerant based adder design.
Integr., 2021

2019
FPGA-Based Accelerators of Deep Learning Networks for Learning and Classification: A Review.
IEEE Access, 2019

2018
Double Modular Redundancy (DMR) Based Fault Tolerance Technique for Combinational Circuits.
J. Circuits Syst. Comput., 2018

2017
A Fault Tolerance Technique for Combinational Circuits Based on Selective-Transistor Redundancy.
IEEE Trans. Very Large Scale Integr. Syst., 2017

An integrated fault tolerance technique for combinational circuits based on implications and transistor sizing.
Integr., 2017

A probabilistic pairwise swap search state assignment algorithm for sequential circuit optimization.
Integr., 2017

Finite state machine-based fault tolerance technique with enhanced area and power of synthesised sequential circuits.
IET Comput. Digit. Tech., 2017

2016
A low-cost platform for the prototyping and characterization of digital circuit IPs.
Integr., 2016

Majority-based evolution state assignment algorithm for area and power optimisation of sequential circuits.
IET Comput. Digit. Tech., 2016

Cuckoo search based resource optimization of datacenters.
Appl. Intell., 2016

2015
Simulation-Based Method for Synthesizing Soft Error Tolerant Combinational Circuits.
IEEE Trans. Reliab., 2015

Towards a Test Definition Language for Integrated Circuits.
J. Circuits Syst. Comput., 2015

State assignment for area minimization of sequential circuits based on cuckoo search optimization.
Comput. Electr. Eng., 2015

State assignment for power optimization of sequential circuits based on a probabilistic pairwise swap search algorithm.
Proceedings of the IEEE International Symposium on Signal Processing and Information Technology, 2015

A sequential circuit fault tolerance technique with enhanced area and power.
Proceedings of the IEEE International Symposium on Signal Processing and Information Technology, 2015

2014
A generalized modular redundancy scheme for enhancing fault tolerance of combinational circuits.
Microelectron. Reliab., 2014

A finite state machine based fault tolerance technique for sequential circuits.
Microelectron. Reliab., 2014

2013
Binary particle swarm optimization (BPSO) based state assignment for area minimization of sequential circuits.
Appl. Soft Comput., 2013

Enhancing Reliability of Combinational Circuits against Soft Errors by Using a Generalized Modular Redundancy Scheme.
Proceedings of the 2013 International Symposium on Electronic System Design, 2013

2012
A new scheme of test data compression based on equal-run-length coding (ERLC).
Integr., 2012

2011
Test data compression based on geometric shapes.
Comput. Electr. Eng., 2011

2010
A scheme of test data compression based on coding of even bits marking and selective output inversion.
Comput. Electr. Eng., 2010

2009
Defect-tolerant n<sup>2</sup>-transistor structure for reliable nanoelectronic designs.
IET Comput. Digit. Tech., 2009

Reconfigurable broadcast scan compression using relaxation-based test vector decomposition.
IET Comput. Digit. Tech., 2009

A new collaborative scheme of test vector compression based on equal-run-length coding (ERLC).
Proceedings of the 13th International Conference on Computers Supported Cooperative Work in Design, 2009

2008
Efficient test compression technique based on block merging.
IET Comput. Digit. Tech., 2008

Test data compression for system-on-a-chip using extended frequency-directed run-length code.
IET Comput. Digit. Tech., 2008

New Technique for Improving Performance of LDPC Codes in the Presence of Trapping Sets.
EURASIP J. Wirel. Commun. Netw., 2008

Transistor-level based defect tolerance for reliable nanoelectronics.
Proceedings of the 6th ACS/IEEE International Conference on Computer Systems and Applications, 2008

Using input/output queues to increase LDPC decoder performance.
Proceedings of the 6th ACS/IEEE International Conference on Computer Systems and Applications, 2008

2007
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering.
IET Comput. Digit. Tech., 2007

A Reconfigurable Broadcast Scan Compression Scheme Using Relaxation Based Test Vector Decompos.
Proceedings of the 16th Asian Test Symposium, 2007

2006
Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Evolutionary algorithms for VLSI multi-objective netlist partitioning.
Eng. Appl. Artif. Intell., 2006

Finite state machine state assignment for area and power minimization.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

An efficient test vector compression technique based on block merging.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

2004
An efficient test relaxation technique for synchronous sequential circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

2003
Test vector decomposition-based static compaction algorithms for combinational circuits.
ACM Trans. Design Autom. Electr. Syst., 2003

General iterative heuristics for VLSI multiobjective partitioning.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

Simulated evolution algorithm for multiobjective VLSI netlist bi-partitioning.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

On efficient extraction of partially specified test sets for synchronous sequential circuits.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

Enhancing performance of iterative heuristics for VLSI netlist partitioning.
Proceedings of the 2003 10th IEEE International Conference on Electronics, 2003

A static test compaction technique for combinational circuits based on independent fault clustering.
Proceedings of the 2003 10th IEEE International Conference on Electronics, 2003

A hybrid test compression technique for efficient testing of systems-on-a-chip.
Proceedings of the 2003 10th IEEE International Conference on Electronics, 2003

2002
An Efficient Test Relaxation Technique for Combinational & Full-Scan Sequential Circuits.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

An efficient test relaxation technique for combinational circuits based on critical path tracing.
Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002

Extended frequency-directed run-length code with improved application to system-on-a-chip test data compression.
Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002

2001
A Geometric-Primitives-Based Compression Scheme for Testing Systems-on-a-Chip.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

A retiming-based test pattern generator design for built-in self test of data path architectures.
Proceedings of the 2001 International Symposium on Circuits and Systems, 2001

An efficient test vector compression technique based on geometric shapes [system-on-a-chip].
Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001

Fuzzified Iterative Algorithms for Performance Driven Low Power VLSI Placement.
Proceedings of the 19th International Conference on Computer Design (ICCD 2001), 2001

1998
A Fast Sequential Learning Technique for Real Circuits with Application to Enhancing ATPG Performance.
Proceedings of the 35th Conference on Design Automation, 1998

1997
Behavior and testability preservation under the retiming transformation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

1996
A complexity analysis of sequential ATPG.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

1995
Delay-fault testability preservation of the concurrent decomposition and factorization transformations.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Testability Implications of Performance-Driven Logic Synthesis.
IEEE Des. Test Comput., 1995

Complexity of sequential ATPG.
Proceedings of the 1995 European Design and Test Conference, 1995

On Test Set Preservation of Retimed Circuits.
Proceedings of the 32st Conference on Design Automation, 1995

1992
Recent advances in logic synthesis with testability.
Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992


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