Hans A. R. Manhaeve

According to our database, Hans A. R. Manhaeve authored at least 19 papers between 1994 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2020

On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs.

Ghazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2015

Dependable Multicore Architectures at Nanoscale: The View From Europe.

Marco Ottavi, Salvatore Pontarelli, Dimitris Gizopoulos, Cristiana Bolchini, Maria K. Michael, Lorena Anghel, Mehdi Baradaran Tahoori, Antonis M. Paschalis, Pedro Reviriego, Oliver Bringmann, Viacheslav Izosimov, Hans A. R. Manhaeve, Christos Strydis, Said Hamdioui

IEEE Des. Test, 2015

2013

Guest Editorial - Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN).

Dimitris Gizopoulos, Said Hamdioui, Hans A. R. Manhaeve

J. Electron. Test., 2013

Semiconductor failure modes and mitigation for critical systems embedded tutorial.

Hans A. R. Manhaeve, Esko Mikkola

Proceedings of the 18th IEEE European Test Symposium, 2013

Current testing: Dead or alive?

Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello

Proceedings of the 18th IEEE European Test Symposium, 2013

2008

The Quest for Test: Will Redundancy Cover All?

Hans A. R. Manhaeve

Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality.

B. Straka, Hans A. R. Manhaeve, J. Brenkus, Stefaan Kerckenaere

Proceedings of the Design, Automation and Test in Europe, 2008

2005

Current Testing for Nanotechnologies: A Demystifying Application Perspective..

Hans A. R. Manhaeve

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

Current testing for nanotechnologies: Myths, facts, and figures.

Hans A. R. Manhaeve

IEEE Des. Test Comput., 2004

2003

A practical evaluation of I_DDQ test strategies for deep submicron production test application. Experiences and targets from the field.

Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve

Proceedings of the 8th European Test Workshop, 2003

2002

A real world application used to implement a true IDDQ based test strategy (facts and figures).

Hans A. R. Manhaeve, Joseph S. Vaccaro, Loren Benecke, David Prystasz

Proceedings of the 7th European Test Workshop, 2002

2001

An On-Chip Detection Circuit for the Verification of IC Supply Connections.

Hans A. R. Manhaeve, Stefaan Kerckenaere

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

2000

Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology.

Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil

J. Electron. Test., 2000

1999

On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC.

Viera Stopjaková, Hans A. R. Manhaeve, M. Sidiropulos

Proceedings of the 1999 Design, 1999

1998

IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit.

M. Svajda, B. Straka, Hans A. R. Manhaeve

Proceedings of the 1998 Design, 1998

A Fully Digital Controlled Off-Chip IDDQ Measurement Unit.

B. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda

Proceedings of the 1998 Design, 1998

1997

A monolithic off-chip IDDQ monitor.

M. Svajda, B. Straka, Hans A. R. Manhaeve

Proceedings of the European Design and Test Conference, 1997

CCII+ current conveyor based BIC monitor for I_DDQ testing of complex CMOS circuits.

Viera Stopjaková, Hans A. R. Manhaeve

Proceedings of the European Design and Test Conference, 1997

1994

An Off-chip I_DDQ Current Measurement Unit for Telecommunication ASICs.

Hans A. R. Manhaeve, Paul L. Wrighton, Jos van Sas, Urbain Swerts

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994