Arun Radhakrishnan

According to our database, Arun Radhakrishnan authored at least 8 papers between 2005 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Provably secure data selective sharing scheme with cloud-based decentralized trust management systems.

Velmurugan Sambath, Mohan Prakash, S. Neelakandan, Arun Radhakrishnan

J. Cloud Comput., December, 2024

Precision Modulated Shading with Bfloat16 for Mobile GPU.

Junmo Park, SeYeong Byeon, Arun Radhakrishnan, Sangwon Park, Wilson Fung, Donghee Han

Proceedings of the IEEE International Conference on Consumer Electronics, 2024

2022

C SVM Classification and KNN Techniques for Cyber Crime Detection.

K. Veena, K. Meena, Yuvaraja Teekaraman, Ramya Kuppusamy, Arun Radhakrishnan

Wirel. Commun. Mob. Comput., 2022

2021

A Prognostic Three-Axis Coordination Model for Supply Chain Regulation Using Machine Learning Algorithm.

Hariprasath Manoharan, Yuvaraja Teekaraman, Ramya Kuppusamy, Arun Radhakrishnan, Mohamed Yaseen Jabarulla

Sci. Program., 2021

2019

A Distributed Autonomous and Collaborative Multi-Robot System Featuring a Low-Power Robot SoC in 22nm CMOS for Integrated Battery-Powered Minibots.

Vinayak Honkote, Dileep Kurian, Sriram Muthukumar, Dibyendu Ghosh, Satish Yada, Kartik Jain, Bradley Jackson, Ilya Klotchkov, Mallikarjuna Rao Nimmagadda, Shreela Dattawadkar, Pranjali Deshmukh, Ankit Gupta, Jaykant Timbadiya, Ravi Pali, Karthik Narayanan, Saksham Soni, Saransh Chhabra, Praveen Dhama, N. Sreenivasulu, Jisna Kollikunnel, Sureshbabu Kadavakollu, Vijay Deepak Sivaraj, Paolo A. Aseron, Leonid Azarenkov, Nancy Robinson, Arun Radhakrishnan, Mikhail J. Moiseev, Ganeshram Nandakumar, Akhila Madhukumar, Roman Popov, Kamakhya P. Sahu, Ramesh Peguvandla, Alberto Del Rio Ruiz, Mukesh Bhartiya, Anuradha Srinivasan, Vivek De

Proceedings of the IEEE International Solid- State Circuits Conference, 2019

2006

Testing On-Die Process Variation in Nanometer VLSI.

Mehrdad Nourani, Arun Radhakrishnan

IEEE Des. Test Comput., 2006

Modeling and Testing Process Variation in Nanometer CMOS.

Mehrdad Nourani, Arun Radhakrishnan

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Power-supply noise in SoCs: ATPG, estimation and control.

Mehrdad Nourani, Arun Radhakrishnan

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005