Eduardo L. A. Macchione

According to our database, Eduardo L. A. Macchione authored at least 4 papers between 2017 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

J. Electron. Test., August, 2023

2021

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2017

Analysis of single-event upsets in a Microsemi ProAsic3E FPGA.

Paulo Ricardo Cechelero Villa, Roger C. Goerl, Fabian Vargas, Leticia B. Poehls, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei Aparecida Guazzelli da Silveira, Eduardo Augusto Bezerra

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

Ionizing radiation effects on a COTS low-cost RISC microcontroller.

Felipe G. H. Leite, Roberto B. B. Santos, Nilberto H. Medina, Vitor A. P. Aguiar, Renato C. Giacomini, Nemitala Added, Fernando Aguirre, Eduardo L. A. Macchione, Fabian Vargas, Marcilei Aparecida Guazzelli da Silveira

Proceedings of the 18th IEEE Latin American Test Symposium, 2017