Elie Maricau

According to our database, Elie Maricau authored at least 18 papers between 2008 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2013

Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS.

Georges G. E. Gielen, Elie Maricau

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Offset measurement method for accurate characterization of BTI-induced degradation in opamps.

Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen

Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012

Hierarchical analog circuit reliability analysis using multivariate nonlinear regression and active learning sample selection.

Elie Maricau, Dimitri de Jonghe, Georges G. E. Gielen

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

Advances in variation-aware modeling, verification, and testing of analog ICs.

Dimitri de Jonghe, Elie Maricau, Georges G. E. Gielen, Trent McConaghy, Bratislav Tasic, Haralampos-G. D. Stratigopoulos

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

Designing reliable analog circuits in an unreliable world.

Georges G. E. Gielen, Elie Maricau, Pieter De Wit

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2011

Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS.

Elie Maricau, Georges G. E. Gielen

IEEE J. Emerg. Sel. Topics Circuits Syst., 2011

Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS.

Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen

Proceedings of the 18th IEEE International Conference on Electronics, Circuits and Systems, 2011

Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines.

Elie Maricau, Georges G. E. Gielen

Proceedings of the 37th European Solid-State Circuits Conference, 2011

Stochastic circuit reliability analysis.

Elie Maricau, Georges G. E. Gielen

Proceedings of the Design, Automation and Test in Europe, 2011

Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation.

Georges G. E. Gielen, Elie Maricau, Pieter De Wit

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis.

Elie Maricau, Georges G. E. Gielen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

Design automation towards reliable analog integrated circuits.

Georges G. E. Gielen, Elie Maricau, Pieter De Wit

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

Variability-aware reliability simulation of mixed-signal ICs with quasi-linear complexity.

Elie Maricau, Georges G. E. Gielen

Proceedings of the Design, Automation and Test in Europe, 2010

2009

A methodology for measuring transistor ageing effects towards accurate reliability simulation.

Elie Maricau, Georges G. E. Gielen

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?.

Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Christos A. Papachristou

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

Efficient reliability simulation of analog ICs including variability and time-varying stress.

Elie Maricau, Georges G. E. Gielen

Proceedings of the Design, Automation and Test in Europe, 2009

2008

An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications.

Elie Maricau, Pieter De Wit, Georges G. E. Gielen

Microelectron. Reliab., 2008

Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies.

Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría

Proceedings of the Design, Automation and Test in Europe, 2008