Nicolas Guitard

According to our database, Nicolas Guitard authored at least 11 papers between 2003 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Recovery of Intrinsic Heterojunction Bipolar Transistors Profiles by Neural Networks.

Grégoire Caron, Anatoli B. Juditsky, Nicolas Guitard, Didier Céli

Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

2020

Smart Way to Adjust Schottky Barrier Height in 130 nm BiCMOS Process for sub-THz Applications.

Vincent Gidel, Frédéric Gianesello, Pascal Chevalier, Grégory Avenier, Nicolas Guitard, Michel Buczko, Cyril Luxey, Guillaume Ducournau

Proceedings of the 2020 IEEE Radio and Wireless Symposium, 2020

2018

Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes.

Jorge Loayza, Nicolas Guitard, Bruno Allard, Luong-Viêt Phung, Blaise Jacquier, Philippe Galy

Microelectron. Reliab., 2018

2012

Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology.

Philippe Galy, Johan Bourgeat, Jean Jimenez, Nicolas Guitard, Alexandre Dray, Ghislain Troussier, Blaise Jacquier, David Marin-Cudraz

Microelectron. Reliab., 2012

BIMOS transistor and its applications in ESD protection in advanced CMOS technology.

Philippe Galy, Jean Jimenez, Johan Bourgeat, A. Dray, Ghislain Troussier, Boris Heitz, Nicolas Guitard, David Marin-Cudraz, H. Beckrich-Ros

Proceedings of the IEEE International Conference on IC Design & Technology, 2012

2007

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements.

Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères

Microelectron. Reliab., 2007

2006

Application of various optical techniques for ESD defect localization.

Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2006

2005

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.

Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2005

2004

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.

Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas

Microelectron. Reliab., 2004

Study of the ESD defects impact on ICs reliability.

Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2004

2003

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.

David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères

Microelectron. Reliab., 2003