Fanyu Liu

Orcid: 0000-0002-6154-4971

According to our database1, Fanyu Liu authored at least 6 papers between 2012 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2023
On the Ion Line Calibration by Plasma Line in ISR Measurements.
Remote. Sens., March, 2023

The Effects of $\gamma$ Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Single Event Induced Crosstalk of Monolithic 3D Circuits Based on a 22 nm FD-SOI Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology.
Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2022

2021
Nano-scaled transistor reliability characterization at nano-second regime.
Sci. China Inf. Sci., 2021

2012
Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism.
Microelectron. Reliab., 2012


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