Francois Lefevre

According to our database, Francois Lefevre authored at least 23 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

J. Electron. Test., April, 2023

Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing".

Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

2021

Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition.

T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

J. Electron. Test., 2021

Exploring on-line RF performance monitoring based on the indirect test strategy.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli.

Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre

Proceedings of the 26th IEEE European Test Symposium, 2021

Digital test of ZigBee transmitters: Validation in industrial test environment.

Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

J. Electron. Test., 2020

Implementing indirect test of RF circuits without compromising test quality: a practical case study.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot

Proceedings of the IEEE Latin-American Test Symposium, 2020

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.

Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

EVM measurement of RF ZigBee transceivers using standard digital ATE.

T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019

Which metrics to use for RF indirect test strategy?

Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre

Proceedings of the 16th International Conference on Synthesis, 2019

Use of ensemble methods for indirect test of RF circuits: can it bring benefits?

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

Proceedings of the IEEE Latin American Test Symposium, 2019

Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition.

T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE.

T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

2016

Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits.

Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre

J. Circuits Syst. Comput., 2016

SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE.

Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre

J. Electron. Test., 2016

2015

Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range.

Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre

J. Electron. Test., 2015

A digital technique for the evaluation of SSB phase noise of analog/RF signals.

Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre

Proceedings of the 16th Latin-American Test Symposium, 2015

A new technique for low-cost phase noise production testing from 1-bit signal acquisition.

Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the 20th IEEE European Test Symposium, 2015

Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals.

Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

Phase noise measurement on IF analog signals using standard digital ATE resources.

Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the IEEE 12th International New Circuits and Systems Conference, 2014

Low-cost phase noise testing of complex RF ICs using standard digital ATE.

Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the 2014 International Test Conference, 2014