Laurent Latorre
Orcid: 0000-0003-0478-1572
According to our database1,
Laurent Latorre
authored at least 51 papers
between 1999 and 2023.
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Bibliography
2023
Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing".
Proceedings of the 24th IEEE Latin American Test Symposium, 2023
2022
Sensors, 2022
2021
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021
Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli.
Proceedings of the 26th IEEE European Test Symposium, 2021
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
2020
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.
Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020
2019
Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition.
Proceedings of the 24th IEEE European Test Symposium, 2019
2018
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018
2017
Combo of innovative educational approaches to teach industrial test to undergraduate students.
Proceedings of the 2017 IEEE Global Engineering Education Conference, 2017
2016
Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits.
J. Circuits Syst. Comput., 2016
J. Electron. Test., 2016
Proceedings of the Interactive Collaborative Learning - Proceedings of the 19th ICL Conference, 2016
Per peers learning educational approach to teach industrial test to undergraduate students.
Proceedings of the 11th European Workshop on Microelectronics Education, 2016
Proceedings of the 2016 IEEE Global Engineering Education Conference, 2016
2015
Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range.
J. Electron. Test., 2015
Proceedings of the 16th Latin-American Test Symposium, 2015
A new technique for low-cost phase noise production testing from 1-bit signal acquisition.
Proceedings of the 20th IEEE European Test Symposium, 2015
Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015
2014
Proceedings of the IEEE 12th International New Circuits and Systems Conference, 2014
Proceedings of the 2014 International Test Conference, 2014
2012
Proceedings of the 10th IEEE International NEWCAS Conference, 2012
Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE).
Proceedings of the 10th IEEE International NEWCAS Conference, 2012
An efficient control variates method for yield estimation of analog circuits based on a local model.
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012
2011
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources.
J. Electron. Test., 2011
2010
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels.
Proceedings of the 11th Latin American Test Workshop, 2010
A low power interface circuit for resistive sensors with digital offset compensation.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
Proceedings of the 15th European Test Symposium, 2010
2009
Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering.
Int. J. Online Eng., 2009
Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE.
Proceedings of the Eighteentgh Asian Test Symposium, 2009
2008
Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS
CoRR, 2008
CoRR, 2008
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2008
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2008
Proceedings of the 2008 IEEE International Behavioral Modeling and Simulation Workshop, 2008
2006
J. Electron. Test., 2006
2005
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005
Test Engineering Education in Europe - The CRTC experience through the EuNICE-Test project.
Proceedings of the New Trends and Technologies in Computer-Aided Learning for Computer-Aided Design, 2005
Proceedings of the 10th European Test Symposium, 2005
2004
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004
Proceedings of the 9th European Test Symposium, 2004
2002
Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining.
Microelectron. Reliab., 2002
Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology.
Proceedings of the 3rd Latin American Test Workshop, 2002
Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems.
Proceedings of the 2002 Design, 2002
2001
J. Electron. Test., 2001
Impact of Technology Spreading on MEMS design Robustness.
Proceedings of the SOC Design Methodologies, 2001
Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing.
Proceedings of the SOC Design Methodologies, 2001
1999
Proceedings of the 1999 Design, 1999