Vincent Kerzerho

According to our database, Vincent Kerzerho authored at least 41 papers between 2006 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

J. Electron. Test., April, 2023

First Step Towards a Fully-Miniaturized Intra-body Communication Transceiver Based on Galvanic Coupling.

Stéphane Pitou, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard, Fabien Soulier, Vincent Kerzerho

Proceedings of the Advances in Information and Communication, 2023

2021

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

J. Electron. Test., 2021

Exploring on-line RF performance monitoring based on the indirect test strategy.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2020

Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

J. Electron. Test., 2020

Implementing indirect test of RF circuits without compromising test quality: a practical case study.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot

Proceedings of the IEEE Latin-American Test Symposium, 2020

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.

Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

2019

Very Low Resource Digital Implementation of Bioimpedance Analysis.

Fabien Soulier, Achraf Lamlih, Vincent Kerzerho, Serge Bernard, Tristan Rouyer

Sensors, 2019

Breaking the speed-power-accuracy trade-off in current mirror with non-linear CCII feedback.

Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzèrho, Guy Cathébras

Microelectron. J., 2019

Which metrics to use for RF indirect test strategy?

Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre

Proceedings of the 16th International Conference on Synthesis, 2019

Use of ensemble methods for indirect test of RF circuits: can it bring benefits?

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

Proceedings of the IEEE Latin American Test Symposium, 2019

2018

On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints.

Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard

J. Electron. Test., 2018

A Hybrid Bioimpedance Spectroscopy Architecture for a Wide Frequency Exploration of Tissue Electrical Properties.

Achraf Lamlih, Philippe Freitas, Mohamed Moez Belhaj, Jérémie Salles, Vincent Kerzerho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain Bonhommeau

Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018

Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance Measurements.

Achraf Lamlih, Philippe Freitas, Stephane David-Grignot, Jérémie Salles, Vincent Kerzèrho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain Bonhommeau

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

A Multitone Analysis for Bioimpedance Spectroscopy using Minimal Digital Ressource.

Fabien Soulier, Achraf Lamlih, Vincent Kerzerho, Serge Bernard

Proceedings of the 12th International Conference on Sensing Technology, 2018

Improvement of Active-Input Current Mirrors Using Adaptive Biasing Technique.

Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzerho, Guy Cathébras

Proceedings of the Conference on Design of Circuits and Integrated Systems, 2018

2017

Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device.

Anthony Deluthault, Luc Mezenge, Philippe Cauvet, Vincent Kerzerho, Fabien Soulier, Serge Bernard

J. Sensors, 2017

New Calibration Technique of Contact-less Resonant Biosensor.

Anthony Deluthault, Vincent Kerzerho, Serge Bernard, Fabien Soulier, Philippe Cauvet

J. Electron. Test., 2017

Formal analysis of high-performance stabilized active-input current mirror.

Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzerho, Guy Cathébras

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

Formal analysis of bandwidth enhancement for high-performance active-input current mirror.

Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzerho, Guy Cathébras

Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

2015

Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies.

Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Microelectron. J., 2015

A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy.

Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Toward Adaptation of ADCs to Operating Conditions through On-chip Correction.

Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

2014

Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Microelectron. J., 2014

Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing.

Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell

Proceedings of the 15th Latin American Test Workshop, 2014

Solutions for the self-adaptation of communicating systems in operation.

Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

New implementions of predictive alternate analog/RF test with augmented model redundancy.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC.

Vincent Kerzerho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Chuan Shan, G. Bontorin, Michel Renovell

Microelectron. J., 2013

Accurate and efficient analytical electrical model of antenna for NFC applications.

Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzerho, Florence Azaïs, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti

Proceedings of the IEEE 11th International New Circuits and Systems Conference, 2013

Implementing model redundancy in predictive alternate test to improve test confidence.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Smart selection of indirect parameters for DC-based alternate RF IC testing.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Making predictive analog/RF alternate test strategy independent of training set size.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter.

Vincent Kerzerho, Vincent Fresnaud, Dominique Dallet, Serge Bernard, Lilian Bossuet

IEEE Trans. Instrum. Meas., 2011

Digital Test Method for Embedded Converters with Unknown-Phase Harmonics.

Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell

J. Electron. Test., 2011

2010

Predicting dynamic specifications of ADCs with a low-quality digital input signal.

Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff

Proceedings of the 15th European Test Symposium, 2010

2009

A multi-converter DFT technique for complex SIP: Concepts and validation.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

Proceedings of the 19th European Conference on Circuit Theory and Design, 2009

2008

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib

VLSI Design, 2008

2007

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

IET Comput. Digit. Tech., 2007

"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

Proceedings of the 12th European Test Symposium, 2007

2006

A First Step for an INL Spectral-Based BIST: The Memory Optimization.

Vincent Kerzerho, Serge Bernard, Philippe Cauvet, Jean-Marie Janik

J. Electron. Test., 2006

A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

IEEE Des. Test Comput., 2006