Guillaume Renaud

According to our database, Guillaume Renaud authored at least 7 papers between 2014 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Quantitative Ultrasound Imaging of Bone: Anatomical Images, Tissue Structural Quality, and Pulsatile Blood Flow.

Gabrielle Laloy-Borgna, Nastassia Navasiolava, Pim Hutting, Andréa Bertona, Amadou S. Dia, Sébastien Salles, Anthony Augé, Alice Mazzolini, Quentin Grimal, Olivier Lucidarme, Hervé Locrelle, Jacques Olivier Fortrat, Laurence Vico, Marc-Antoine Custaud, Guillaume Renaud

IEEE Trans. Medical Imaging, May, 2026

2020

An overview of Hybridization of Power sources for Ancillary Service.

Ritu Raj Shrivastwa, Ahmad Hably, Seddik Bacha, Hugo Mesnage, Guillaume Renaud

Proceedings of the 2020 IEEE International Conference on Industrial Technology, 2020

2019

Fully Differential 4-V Output Range 14.5-ENOB Stepwise Ramp Stimulus Generator for On-Chip Static Linearity Test of ADCs.

Guillaume Renaud, Mamadou Diallo, Manuel J. Barragán, Salvador Mir

IEEE Trans. Very Large Scale Integr. Syst., 2019

2017

Analysis of an efficient on-chip servo-loop technique for reduced-code static linearity test of pipeline ADCs.

Guillaume Renaud, Marc Margalef-Rovira, Manuel J. Barragán, Salvador Mir

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016

A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs.

Guillaume Renaud, Manuel J. Barragán, Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Le Gall, Hervé Naudet

J. Electron. Test., 2016

Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator.

Antonio J. Ginés, Eduardo J. Peralías, Gildas Léger, Adoración Rueda, Guillaume Renaud, Manuel J. Barragán, Salvador Mir

Proceedings of the 21th IEEE European Test Symposium, 2016

2014

On-Chip Implementation of an Integrator-Based Servo-Loop for ADC Static Linearity Test.

Guillaume Renaud, Manuel J. Barragán, Salvador Mir, Marc Sabut

Proceedings of the 23rd IEEE Asian Test Symposium, 2014