Haithem Ayari

According to our database, Haithem Ayari authored at least 7 papers between 2012 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Multilevel operation in oxide based resistive RAM with SET voltage modulation.

Hassen Aziza, Haithem Ayari, Santhosh Onkaraiah, Mathieu Moreau, Jean-Michel Portal, Marc Bocquet

Proceedings of the 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2016

2014

Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Microelectron. J., 2014

Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability.

Hassen Aziza, Haithem Ayari, Santhosh Onkaraiah, Jean-Michel Portal, Mathieu Moreau, Marc Bocquet

Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

New implementions of predictive alternate analog/RF test with augmented model redundancy.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Implementing model redundancy in predictive alternate test to improve test confidence.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Smart selection of indirect parameters for DC-based alternate RF IC testing.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Making predictive analog/RF alternate test strategy independent of training set size.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell

Proceedings of the 2012 IEEE International Test Conference, 2012