John Barth

Affiliations:
  • IBM Systems and Technology Group, Essex Junction, VT, USA


According to our database1, John Barth authored at least 16 papers between 1995 and 2012.

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Bibliography

2012
Isolated Preset Architecture for a 32nm SOI embedded DRAM macro.
Proceedings of the Symposium on VLSI Circuits, 2012

Performance analysis and modeling of deep trench decoupling capacitor for 32 nm high-performance SOI processors and beyond.
Proceedings of the IEEE International Conference on IC Design & Technology, 2012

2011
A 45 nm SOI Embedded DRAM Macro for the POWER™ Processor 32 MByte On-Chip L3 Cache.
IEEE J. Solid State Circuits, 2011

Three Dimensional integration - Considerations for memory applications.
Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

2010
A 45nm SOI embedded DRAM macro for POWER7TM 32MB on-chip L3 cache.
Proceedings of the IEEE International Solid-State Circuits Conference, 2010

2009
A 1 MB Cache Subsystem Prototype With 1.8 ns Embedded DRAMs in 45 nm SOI CMOS.
IEEE J. Solid State Circuits, 2009

2008
A 500 MHz Random Cycle, 1.5 ns Latency, SOI Embedded DRAM Macro Featuring a Three-Transistor Micro Sense Amplifier.
IEEE J. Solid State Circuits, 2008

An on-chip dual supply charge pump system for 45nm PD SOI eDRAM.
Proceedings of the ESSCIRC 2008, 2008

2007
A 500MHz Random Cycle 1.5ns-Latency, SOI Embedded DRAM Macro Featuring a 3T Micro Sense Amplifier.
Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

2005
A 500-MHz multi-banked compilable DRAM macro with direct write and programmable pipelining.
IEEE J. Solid State Circuits, 2005

Embedded DRAM: Technology platform for the Blue Gene/L chip.
IBM J. Res. Dev., 2005

2003
A 5.6-ns random cycle 144-Mb DRAM with 1.4 Gb/s/pin and DDR3-SRAM interface.
IEEE J. Solid State Circuits, 2003

2002
Embedded DRAM design and architecture for the IBM 0.11-µm ASIC offering.
IBM J. Res. Dev., 2002

2001
Embedded DRAM built in self test and methodology for test insertion.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1998
Processor-based built-in self-test for embedded DRAM.
IEEE J. Solid State Circuits, 1998

1995
Multipurpose DRAM architecture for optimal power, performance, and product flexibility.
IBM J. Res. Dev., 1995


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