Jing Guo

According to our database, Jing Guo authored at least 18 papers between 2013 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

A Polarity-Driven Radiation-Hardened Latch design for Single Event Upset Tolerance.

Shanshan Liu, Jing Guo, Xiaochen Tang, Pedro Reviriego, Fabrizio Lombardi

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS.

Aibin Yan, Chaoping Lai, Yinlei Zhang, Jie Cui, Zhengfeng Huang, Jie Song, Jing Guo, Xiaoqing Wen

IEEE Trans. Emerg. Top. Comput., 2021

Exploiting Asymmetry in eDRAM Errors for Redundancy-Free Error-Tolerant Design.

Shanshan Liu, Pedro Reviriego, Jing Guo, Jie Han, Fabrizio Lombardi

IEEE Trans. Emerg. Top. Comput., 2021

High-Performance CMOS Latch Designs for Recovering All Single and Double Node Upsets.

Jing Guo, Shanshan Liu, Xiaohui Su, Chunhua Qi, Fabrizio Lombardi

IEEE Trans. Aerosp. Electron. Syst., 2021

2020

Design and Evaluation of Low-Complexity Radiation Hardened CMOS Latch for Double-Node Upset Tolerance.

Jing Guo, Shanshan Liu, Lei Zhu, Fabrizio Lombardi

IEEE Trans. Circuits Syst. I Regul. Pap., 2020

Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology.

Nan Zhang, Xiaohui Su, Jing Guo

IEEE Access, 2020

Self-Recovery Tolerance Latch Design Based on the Radiation Mechanism.

Qiang Li, Xiaohui Su, Jing Guo, Chunhua Qi

IEEE Access, 2020

2019

A CMOS Majority Logic Gate and its Application to One-Step ML Decodable Codes.

Jing Guo, Shanshan Liu, Lei Zhu, Fabrizio Lombardi

IEEE Trans. Very Large Scale Integr. Syst., 2019

2018

Design of Area-Efficient and Highly Reliable RHBD 10T Memory Cell for Aerospace Applications.

Jing Guo, Lei Zhu, Yu Sun, Huiliang Cao, Hai Huang, Tianqi Wang, Chunhua Qi, Rongsheng Zhang, Xuebing Cao, Liyi Xiao, Zhigang Mao

IEEE Trans. Very Large Scale Integr. Syst., 2018

2017

Novel Radiation-Hardened-by-Design (RHBD) 12T Memory Cell for Aerospace Applications in Nanoscale CMOS Technology.

Jing Guo, Lei Zhu, Wenyi Liu, Hai Huang, Shanshan Liu, Tianqi Wang, Liyi Xiao, Zhigang Mao

IEEE Trans. Very Large Scale Integr. Syst., 2017

A Cost-Effective Relative Humidity Sensor Based on Side Coupling Induction Technology.

Yingzi Zhang, Yulong Hou, Wenyi Liu, Huixin Zhang, Yanjun Zhang, Zhidong Zhang, Jing Guo, Jia Liu, Liang Zhang, Qiu-lin Tan

Sensors, 2017

2015

Soft Error Hardened Memory Design for Nanoscale Complementary Metal Oxide Semiconductor Technology.

Jing Guo, Liyi Xiao, Tianqi Wang, Shanshan Liu, Xu Wang, Zhigang Mao

IEEE Trans. Reliab., 2015

Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology.

Chunhua Qi, Liyi Xiao, Jing Guo, Tianqi Wang

Microelectron. Reliab., 2015

Hardened design based on advanced orthogonal Latin code against two adjacent multiple bit upsets (MBUs) in memories.

Liyi Xiao, Jiaqiang Li, Jie Li, Jing Guo

Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

Fault Secure Encoder and Decoder Designs for Matrix Codes.

Shanshan Liu, Liyi Xiao, Jing Guo, Zhigang Mao

Proceedings of the 14th International Conference on Computer-Aided Design and Computer Graphics, 2015

2014

Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code.

Jing Guo, Liyi Xiao, Zhigang Mao, Qiang Zhao

IEEE Trans. Very Large Scale Integr. Syst., 2014

Novel Low-Power and Highly Reliable Radiation Hardened Memory Cell for 65 nm CMOS Technology.

Jing Guo, Liyi Xiao, Zhigang Mao

IEEE Trans. Circuits Syst. I Regul. Pap., 2014

2013

Novel Mixed Codes for Multiple-Cell Upsets Mitigation in Static RAMs.

Jing Guo, Liyi Xiao, Zhigang Mao, Qiang Zhao

IEEE Micro, 2013