Joonsung Park

According to our database, Joonsung Park authored at least 17 papers between 2006 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Fault-based Built-in Self-test and Evaluation of Phase Locked Loops.

Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev

ACM Trans. Design Autom. Electr. Syst., 2021

2019

Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection.

Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev

Proceedings of the 24th IEEE European Test Symposium, 2019

2017

High precision yet wide range on-chip oscillator with dual charge-discharge technique.

Abhijit Das, Joonsung Park

Proceedings of the 18th International Symposium on Quality Electronic Design, 2017

A 12-/14-bit, 4/2MSPS, 0.085mm² SAR ADC in 65nm using novel residue boosting.

Joonsung Park, Krishnaswamy Nagaraj, Mikel Ash, Ajay Kumar

Proceedings of the 2017 IEEE Custom Integrated Circuits Conference, 2017

2016

An oxide electrothermal filter in standard CMOS.

Lorenzo Pedala, Ugur Sonmez, Fabio Sebastiano, Kofi A. A. Makinwa, Krishnaswamy Nagaraj, Joonsung Park

Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016

2015

An Embedded 65 nm CMOS Remote Temperature Sensor With Digital Beta Correction and Series Resistance Cancellation Achieving an Inaccuracy of 0.4^°C (3σ) From - 40^°C to 130^°C.

Xiao Pu, Mikel Ash, Krishnaswamy Nagaraj, Joonsung Park, Steve Vu, Paul Kimelman, Sean de la Haye

IEEE J. Solid State Circuits, 2015

2013

A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented Memories.

Jaeyong Chung, Joonsung Park, Jacob A. Abraham

IEEE Trans. Very Large Scale Integr. Syst., 2013

2011

Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model.

Joonsung Park, Hongjoong Shin, Jacob A. Abraham

J. Electron. Test., 2011

Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.

Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham

J. Electron. Test., 2011

2010

Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.

Hongjoong Shin, Joonsung Park, Jacob A. Abraham

J. Electron. Test., 2010

Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate.

Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

At-speed Test of High-Speed DUT Using Built-Off Test Interface.

Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.

Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh

Proceedings of the 14th IEEE European Test Symposium, 2009

LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits.

Joonsung Park, Jaeyong Chung, Jacob A. Abraham

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Parallel Loopback Test of Mixed-Signal Circuits.

Joonsung Park, Hongjoong Shin, Jacob A. Abraham

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

2007

Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model.

Joonsung Park, Hongjoong Shin, Jacob A. Abraham

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

2006

Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method.

Hongjoong Shin, Joonsung Park, Jacob A. Abraham

Proceedings of the 2006 IEEE International Test Conference, 2006