Alan J. Weger

According to our database1, Alan J. Weger authored at least 23 papers between 2003 and 2018.

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Bibliography

2018
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Time-integrated photon emission as a function of temperature in 32 nm CMOS.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Analyzing path delays for accelerated testing of logic chips.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
Counterfeit IC detection using light emission.
Proceedings of the 2014 International Test Conference, 2014

Verification of untrusted chips using trusted layout and emission measurements.
Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, 2014

2012
Power management of multi-core chips: Challenges and pitfalls.
Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011
MARVEL - Malicious alteration recognition and verification by emission of light.
Proceedings of the HOST 2011, 2011

Early chip planning cockpit.
Proceedings of the Design, Automation and Test in Europe, 2011

2010
Power-efficient, reliable microprocessor architectures: modeling and design methods.
Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, 2010

2008
Keeping hot chips cool: are IC thermal problems hot air?
Proceedings of the 45th Design Automation Conference, 2008

2007
Hotspot-Limited Microprocessors: Direct Temperature and Power Distribution Measurements.
IEEE J. Solid State Circuits, 2007

Temperature-limited microprocessors: Measurements and design implications.
Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007

Thermal-aware task scheduling at the system software level.
Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007

2006
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images.
Proceedings of the 2006 IEEE International Test Conference, 2006

Power Distribution Measurements of the Dual Core PowerPC<sup>TM</sup> 970MP Microprocessor.
Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006

2005
Photon emission microscopy of inter/intra chip device performance variations.
Microelectron. Reliab., 2005

An advanced optical diagnostic technique of IBM z990 eServer microprocessor.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

CMOS IC diagnostics using the luminescence of OFF-state leakage currents.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003
Latchup Analysis Using Emission Microscopy.
Microelectron. Reliab., 2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectron. Reliab., 2003

Optical and Electrical Testing of Latchup in I/O Interface Circuits.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003


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