Matthias Kampmann

According to our database, Matthias Kampmann authored at least 9 papers between 2014 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Logic Fault Diagnosis of Hidden Delay Defects.

Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen

Proceedings of the IEEE International Test Conference, 2020

2019

Built-In Test for Hidden Delay Faults.

Matthias Kampmann, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, Hans-Joachim Wunderlich

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

2018

Design for Small Delay Test - A Simulation Study.

Matthias Kampmann, Sybille Hellebrand

Microelectron. Reliab., 2018

A "Laboratory" as an approach to foster writing skills at software engineering studies: Learning software engineering is easier when writing courses are directly applied to lecture's content and the problems and examples enrolled in.

Matthias Kampmann, Jürgen Mottok

Proceedings of the 2018 IEEE Global Engineering Education Conference, 2018

Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.

Chang Liu, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the 27th IEEE Asian Test Symposium, 2018

2017

Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test.

Matthias Kampmann, Sybille Hellebrand

Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

2016

X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.

Matthias Kampmann, Sybille Hellebrand

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015

Optimized Selection of Frequencies for Faster-Than-at-Speed Test.

Matthias Kampmann, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects.

Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich

Proceedings of the 2014 International Test Conference, 2014