Martin Streibl

According to our database, Martin Streibl authored at least 9 papers between 2002 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

RF ESD protection strategies: Codesign vs. low-C protection.

Wolfgang Soldner, Martin Streibl, U. Hodel, Marc Tiebout, Harald Gossner, Doris Schmitt-Landsiedel, Jung-Hoon Chun, Choshu Ito, Robert W. Dutton

Microelectron. Reliab., 2007

SCR operation mode of diode strings for ESD protection.

Ulrich Glaser, Kai Esmark, Martin Streibl, Christian Russ, Krzysztof Domanski, Mauro Ciappa, Wolfgang Fichtner

Microelectron. Reliab., 2007

A 10GHz Broadband Amplifier with Bootstrapped 2kV ESD Protection.

Wolfgang Soldner, Moon-Jung Kim, Martin Streibl, Harald Gossner, Thomas H. Lee, Doris Schmitt-Landsiedel

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

Cascading Techniques for a High-Speed Memory Interface.

Zheng Gu, Peter Gregorius, Daniel Kehrer, Lydia Neumann, Evelyn Neuscheler, Thomas Rickes, Hermann Ruckerbauer, Ralf Schledz, Martin Streibl, Jürgen Zielbauer

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

2005

High abstraction level permutational ESD concept analysis.

Martin Streibl, Franz Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel

Microelectron. Reliab., 2005

Transient latch-up: experimental analysis and device simulation.

S. Bargstädt-Franke, Wolfgang Stadler, Kai Esmark, Martin Streibl, Krzysztof Domanski, Horst A. Gieser, Heinrich Wolf, Waclaw Bala

Microelectron. Reliab., 2005

ESD-protected CMOS 3-5 GHz wideband LNA+PGA design for UWB.

Raffaele Salerno, Marc Tiebout, Hermann Paule, Martin Streibl, Christoph Sandner, Klaus Kropf

Proceedings of the 31st European Solid-State Circuits Conference, 2005

2003

Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies.

Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner

Microelectron. Reliab., 2003

2002

Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.

Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik

Microelectron. Reliab., 2002