Michael J. Uren

According to our database1, Michael J. Uren authored at least 9 papers between 2003 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Book 
In proceedings 
Article 
PhD thesis 
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Bibliography

2018
On the origin of dynamic Ron in commercial GaN-on-Si HEMTs.
Microelectronics Reliability, 2018

2017
Morphological and electrical comparison of Ti and Ta based ohmic contacts for AlGaN/GaN-on-SiC HFETs.
Microelectronics Reliability, 2017

Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic ron.
Proceedings of the 47th European Solid-State Device Research Conference, 2017

2015
Operating channel temperature in GaN HEMTs: DC versus RF accelerated life testing.
Microelectronics Reliability, 2015

Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence.
Microelectronics Reliability, 2015

2014
Implications of gate-edge electric field in AlGaN/GaN high electron mobility transistors during OFF-state degradation.
Microelectronics Reliability, 2014

Liquid crystal electrography: Electric field mapping and detection of peak electric field strength in AlGaN/GaN high electron mobility transistors.
Microelectronics Reliability, 2014

2012
Development of an RF IV waveform based stress test procedure for use on GaN HFETs.
Microelectronics Reliability, 2012

2003
Low frequency drain noise comparison of AlGaN/GaN HEMT's grown on silicon, SiC and sapphire substrates.
Microelectronics Reliability, 2003


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