Hervé Blanck

According to our database1, Hervé Blanck authored at least 15 papers between 2001 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2018
On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs.
Microelectronics Reliability, 2018

2017
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices.
Microelectronics Reliability, 2017

2016
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures.
Microelectronics Reliability, 2016

2015
Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence.
Microelectronics Reliability, 2015

2014
Proton induced trapping effect on space compatible GaN HEMTs.
Microelectronics Reliability, 2014

Failure signatures on 0.25 μm GaN HEMTs for high-power RF applications.
Microelectronics Reliability, 2014

2013
Qualification of 50 V GaN on SiC technology for RF power amplifiers.
Microelectronics Reliability, 2013

Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs during HTRB stress.
Microelectronics Reliability, 2013

2012
Reliability studies on GaN HEMTs with sputtered Iridium gate module.
Microelectronics Reliability, 2012

Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification.
Microelectronics Reliability, 2012

Improved thermal management for GaN power electronics: Silver diamond composite packages.
Microelectronics Reliability, 2012

2010
Reliability of high voltage/high power L/S-band Hbt technology.
Microelectronics Reliability, 2010

2008
GaAs Industry in Europe - Technologies, Trends and New Developments.
IEICE Transactions, 2008

2002
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology.
Microelectronics Reliability, 2002

2001
Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation.
Microelectronics Reliability, 2001


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