Milind Sonawane

According to our database, Milind Sonawane authored at least 8 papers between 2014 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Next-Gen Scalable In-System-Test Architecture for Nvidia Automotive Platform.

Sailendra Chadalavada, Milind Sonawane, Saranyan Sarangan, Alex Hsu, Pavan Javvaji, Shantanu Sarangi

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

2022

NVIDIA MATHS: Mechanism to Access Test-Data over High-Speed Links.

Mahmut Yilmaz, Pavan Kumar Datla Jagannadha, Kaushik Narayanun, Shantanu Sarangi, Francisco Da Silva, Joe Sarmiento, Smbat Tonoyan, Ashwin Chintaluri, Animesh Khare, Milind Sonawane, Ashish Kumar, Anitha Kalva, Alex Hsu, Jayesh Pandey

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2019

Hybrid Performance Modeling for Optimization of In-System-Structural-Test (ISST) Latency.

Milind Sonawane, Venkat Abilash Reddy Nerallapally, Alex Hsu, Shantanu Sarangi

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Special Session: In-System-Test (IST) Architecture for NVIDIA Drive-AGX Platforms.

Pavan Kumar Datla Jagannadha, Mahmut Yilmaz, Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Bonita Bhaskaran, Shashank Bajpai, Venkat Abilash Reddy Nerallapally, Jayesh Pandey, Sam Jiang

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

2016

Dynamic docking architecture for concurrent testing and peak power reduction.

Milind Sonawane, Pavan Kumar Datla Jagannadha, Sailendra Chadalavada, Shantanu Sarangi, Mahmut Yilmaz, Amit Sanghani, Karthikeyan Natarajan, Jonathon E. Colburn, Anubhav Sinha

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Flexible scan interface architecture for complex SoCs.

Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Amit Sanghani, Mahmut Yilmaz, Pavan Kumar Datla Jagannadha, Jonathon E. Colburn

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Advanced test methodology for complex SoCs.

Pavan Kumar Datla Jagannadha, Mahmut Yilmaz, Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Bonita Bhaskaran, Ayub Abdollahian

Proceedings of the 2016 IEEE International Test Conference, 2016

2014

Achieving extreme scan compression for SoC Designs.

Peter Wohl, John A. Waicukauski, Jonathon E. Colburn, Milind Sonawane

Proceedings of the 2014 International Test Conference, 2014