Amit Sanghani

According to our database1, Amit Sanghani authored at least 6 papers between 2011 and 2016.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2016
A programmable method for low-power scan shift in SoC integrated circuits.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Dynamic docking architecture for concurrent testing and peak power reduction.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Flexible scan interface architecture for complex SoCs.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Test method and scheme for low-power validation in modern SOC integrated circuits.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2011
Design and implementation of a time-division multiplexing scan architecture using serializer and deserializer in GPU chips.
Proceedings of the 29th IEEE VLSI Test Symposium, 2011

A clock-gating based capture power droop reduction methodology for at-speed scan testing.
Proceedings of the Design, Automation and Test in Europe, 2011


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