Ayub Abdollahian

According to our database, Ayub Abdollahian authored at least 6 papers between 2016 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

A Novel Graph-Coloring-Based Solution for Low-Power Scan Shift.

Saurabh Gupta, Bonita Bhaskaran, Shantanu Sarangi, Ayub Abdollahian, Jennifer Dworak

IEEE Des. Test, 2020

2019

An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test.

Seyed Nima Mozaffari, Bonita Bhaskaran, Kaushik Narayanun, Ayub Abdollahian, Vinod Pagalone, Shantanu Sarangi, Jonathon E. Colburn

Proceedings of the IEEE International Test Conference, 2019

2017

At-speed capture global noise reduction & low-power memory test architecture.

Bonita Bhaskaran, Sailendra Chadalavada, Shantanu Sarangi, Nithin Valentine, Venkat Abilash Reddy Nerallapally, Ayub Abdollahian

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016

A programmable method for low-power scan shift in SoC integrated circuits.

Ran Wang, Bonita Bhaskaran, Karthikeyan Natarajan, Ayub Abdollahian, Kaushik Narayanun, Krishnendu Chakrabarty, Amit Sanghani

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Test method and scheme for low-power validation in modern SOC integrated circuits.

Bonita Bhaskaran, Amit Sanghani, Kaushik Narayanun, Ayub Abdollahian, Amit Laknaur

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Advanced test methodology for complex SoCs.

Pavan Kumar Datla Jagannadha, Mahmut Yilmaz, Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Bonita Bhaskaran, Ayub Abdollahian

Proceedings of the 2016 IEEE International Test Conference, 2016