Mohamed Azimane

According to our database, Mohamed Azimane authored at least 11 papers between 1998 and 2012.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2012

Reducing test cost for mixed signal circuits "From TOETS to ELESIS".

Mohamed Azimane

Proceedings of the 17th IEEE European Test Symposium, 2012

2007

Test quality analysis and improvement for an embedded asynchronous FIFO.

Tobias Dubois, Erik Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

High-Quality Memory Test.

Mohamed Azimane

Proceedings of the 14th IEEE International Workshop on Memory Technology, 2006

2005

A New Algorithm for Dynamic Faults Detection in RAMs.

Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Word line pulsing technique for stability fault detection in SRAM cells.

Andrei Pavlov, Mohamed Azimane, José Pineda de Gyvez, Manoj Sachdev

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Memory testing improvements through different stress conditions.

Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen

Proceedings of the 31st European Solid-State Circuits Conference, 2005

Memory Testing Under Different Stress Conditions: An Industrial Evaluation.

Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen

Proceedings of the 2005 Design, 2005

Programmable techniques for cell stability test and debug in embedded SRAMs.

Andrei Pavlov, Manoj Sachdev, José Pineda de Gyvez, Mohamed Azimane

Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

2004

New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders.

Mohamed Azimane, Ananta K. Majhi

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

2001

A special march test to detect delay coupling faults for RAMs.

Mohamed Azimane, Antonio Lloris Ruiz

Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001

1998

New short and efficient algorithm for testing random-access memories.

Mohamed Azimane, Antonio Lloris Ruiz

Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998