Clemens Wouters

According to our database, Clemens Wouters authored at least 6 papers between 1998 and 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2007

Design and DfT of a high-speed area-efficient embedded asynchronous FIFO.

Paul Wielage, Erik Jan Marinissen, Michel Altheimer, Clemens Wouters

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

Test quality analysis and improvement for an embedded asynchronous FIFO.

Tobias Dubois, Erik Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2003

Yield analysis for repairable embedded memories.

Anuja Sehgal, Aishwarya Dubey, Erik Jan Marinissen, Clemens Wouters, Harald P. E. Vranken, Krishnendu Chakrabarty

Proceedings of the 8th European Test Workshop, 2003

2001

A P1500 Compliant Programable BistShell for Embedded Memories.

Sandeep Koranne, Tom Waayers, Robert Beurze, Clemens Wouters, Sunil Kumar, G. S. Visweswara

Proceedings of the 9th IEEE International Workshop on Memory Technology, 2001

1999

Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.

Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff

J. Electron. Test., 1999

1998

A structured and scalable mechanism for test access to embedded reusable cores.

Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998