Naixing Wang

According to our database, Naixing Wang authored at least 14 papers between 2017 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

Conflict-driven Structural Learning Towards Higher Coverage Rate in ATPG.

Hui-Ling Zhen, Naixing Wang, Junhua Huang, Xinyue Huang, Mingxuan Yuan, Yu Huang

CoRR, 2023

GPU-Based Concurrent Static Learning.

Huaxiao Liang, Xiaoze Lin, Liyang Lai, Naixing Wang, Yu Huang, Fei Yang, Yuxin Yang

Proceedings of the IEEE International Test Conference, 2023

2022

Compression-Aware ATPG.

Xing Wang, Zezhong Wang, Naixing Wang, Weiwei Zhang, Yu Huang

Proceedings of the IEEE International Test Conference, 2022

DeepTPI: Test Point Insertion with Deep Reinforcement Learning.

Zhengyuan Shi, Min Li, Sadaf Khan, Liuzheng Wang, Naixing Wang, Yu Huang, Qiang Xu

Proceedings of the IEEE International Test Conference, 2022

Neural Fault Analysis for SAT-based ATPG.

Junhua Huang, Hui-Ling Zhen, Naixing Wang, Hui Mao, Mingxuan Yuan, Yu Huang

Proceedings of the IEEE International Test Conference, 2022

DeepGate: learning neural representations of logic gates.

Min Li, Sadaf Khan, Zhengyuan Shi, Naixing Wang, Huang Yu, Qiang Xu

Proceedings of the DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10, 2022

Accelerate SAT-based ATPG via Preprocessing and New Conflict Management Heuristics.

Junhua Huang, Hui-Ling Zhen, Naixing Wang, Mingxuan Yuan, Hui Mao, Yu Huang, Jiping Tao

Proceedings of the 27th Asia and South Pacific Design Automation Conference, 2022

2021

Representation Learning of Logic Circuits.

Min Li, Sadaf Khan, Zhengyuan Shi, Naixing Wang, Yu Huang, Qiang Xu

CoRR, 2021

2019

Layout Resynthesis by Applying Design-for-manufacturability Guidelines to Avoid Low-coverage Areas of a Cell-based Design.

Naixing Wang, Irith Pomeranz, Sudhakar M. Reddy, Arani Sinha, Srikanth Venkataraman

ACM Trans. Design Autom. Electr. Syst., 2019

Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines.

Naixing Wang, Irith Pomeranz, Sudhakar M. Reddy, Arani Sinha, Srikanth Venkataraman

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

TEA: A Test Generation Algorithm for Designs with Timing Exceptions.

Naixing Wang, Chen Wang, Kun-Han Tsai, Wu-Tung Cheng, Xijiang Lin, Mark Kassab, Irith Pomeranz

Proceedings of the 28th IEEE Asian Test Symposium, 2019

2018

Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests.

Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman

Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018

2017

On Reliability of Android Wearable Health Devices.

Naixing Wang, Edgardo Barsallo Yi, Saurabh Bagchi

CoRR, 2017

Functional Broadside Test Generation Using a Commercial ATPG Tool.

Naixing Wang, Bo Yao, Xijiang Lin, Irith Pomeranz

Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017