Sergei Kostin

According to our database, Sergei Kostin authored at least 23 papers between 2007 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Fast identification of true critical paths in sequential circuits.

Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi

Microelectron. Reliab., 2018

Hierarchical Timing-Critical Paths Analysis in Sequential Circuits.

Lembit Jurimagi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Sergei Kostin

Proceedings of the 28th International Symposium on Power and Timing Modeling, 2018

Parallel Critical Path Tracing Fault Simulation in Sequential Circuits.

Jaak Kousaar, Raimund Ubar, Sergei Kostin, Sergei Devadze, Jaan Raik

Proceedings of the 25th International Conference "Mixed Design of Integrated Circuits and System", 2018

2017

A scalable technique to identify true critical paths in sequential circuits.

Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik

Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

2016

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.

Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros

J. Electron. Test., 2016

A novel random approach to diagnostic test generation.

Emmanuel Ovie Osimiry, Raimund Ubar, Sergei Kostin, Jaan Raik

Proceedings of the IEEE Nordic Circuits and Systems Conference, 2016

Gate-level modelling of NBTI-induced delays under process variations.

Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar

Proceedings of the 17th Latin-American Test Symposium, 2016

A tool set for teaching design-for-testability of digital circuits.

Sergei Kostin, Elmet Orasson, Raimund Ubar

Proceedings of the 11th European Workshop on Microelectronics Education, 2016

2015

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG.

N. Palermo, Valentin Tihhomirov, Thiago Santos Copetti, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Marco Gaudesi, Giovanni Squillero, Matteo Sonza Reorda, Fabian Vargas, Letícia Maria Bolzani Pöhls

Proceedings of the 16th Latin-American Test Symposium, 2015

SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic.

Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Pöhls

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

Hierarchical identification of NBTI-critical gates in nanoscale logic.

Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti

Proceedings of the 15th Latin American Test Workshop, 2014

2013

Accurate Dialysis Dose Evaluation and Extrapolation Algorithms During Online Optical Dialysis Monitoring.

Ivo Fridolin, Deniss Karai, Sergei Kostin, Raimund Ubar

IEEE Trans. Biomed. Eng., 2013

Synthesis of multiple fault oriented test groups from single fault test sets.

Raimund Ubar, Sergei Kostin, Jaan Raik

Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2013

Identifying NBTI-Critical Paths in Nanoscale Logic.

Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Maria Bolzani Poehls

Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

2012

About robustness of test patterns regarding multiple faults.

Raimund Ubar, Sergei Kostin, Jaan Raik

Proceedings of the 13th Latin American Test Workshop, 2012

How to Prove that a Circuit is Fault-Free?

Raimund Ubar, Sergei Kostin, Jaan Raik

Proceedings of the 15th Euromicro Conference on Digital System Design, 2012

Multiple stuck-at-fault detection theorem.

Raimund Ubar, Sergei Kostin, Jaan Raik

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011

Defect-oriented module-level fault diagnosis in digital circuits.

Sergei Kostin, Raimund Ubar, Jaan Raik

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

2009

Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems.

Raimund Ubar, Artur Jutman, Jaan Raik, Sergei Kostin, Heinz-Dietrich Wuttke

Proceedings of the IEEE International Conference on Microelectronic Systems Education, 2009

Investigations of the diagnosibility of digital networks with BIST.

Raimund Ubar, Sergei Kostin, Jaan Raik

Proceedings of the 10th Latin American Test Workshop, 2009

Block-Level Fault Model-Free Debug and Diagnosis in Digital Systems.

Raimund Ubar, Sergei Kostin, Jaan Raik

Proceedings of the 12th Euromicro Conference on Digital System Design, 2009

2008

Embedded fault diagnosis in digital systems with BIST.

Raimund Ubar, Sergei Kostin, Jaan Raik

Microprocess. Microsystems, 2008

2007

Fault Diagnosis in Integrated Circuits with BIST.

Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evartson, Harri Lensen

Proceedings of the Tenth Euromicro Conference on Digital System Design: Architectures, 2007