Seyed Nima Mozaffari

According to our database, Seyed Nima Mozaffari authored at least 10 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST).

Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas M. Satheesh, Kuo Lin Fu, Nithin Valentine, P. Manikandan, Mahmut Yilmaz

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Observation Point Insertion Using Deep Learning.

Bonita Bhaskaran, Sanmitra Banerjee, Kaushik Narayanun, Shao-Chun Hung, Seyed Nima Mozaffari Mojaveri, Mengyun Liu, Gang Chen, Tung-Che Liang

Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, 2022

2019

Low Power Artificial Neural Network Architecture.

Krishna Prasad Gnawali, Seyed Nima Mozaffari, Spyros Tragoudas

CoRR, 2019

An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test.

Seyed Nima Mozaffari, Bonita Bhaskaran, Kaushik Narayanun, Ayub Abdollahian, Vinod Pagalone, Shantanu Sarangi, Jonathon E. Colburn

Proceedings of the IEEE International Test Conference, 2019

2018

A Generalized Approach to Implement Efficient CMOS-Based Threshold Logic Functions.

Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis

IEEE Trans. Circuits Syst. I Regul. Pap., 2018

An Aging Resilient Neural Network Architecture.

Seyed Nima Mozaffari, Krishna Prasad Gnawali, Spyros Tragoudas

Proceedings of the 14th IEEE/ACM International Symposium on Nanoscale Architectures, 2018

2017

More Efficient Testing of Metal-Oxide Memristor-Based Memory.

Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Reducing power, area, and delay of threshold logic gates considering non-integer weights.

Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

A new method to identify threshold logic functions.

Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2015

Fast march tests for defects in resistive memory.

Seyed Nima Mozaffari, Spyros Tragoudas, Themistoklis Haniotakis

Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, 2015