Seyed Nima Mozaffari
Orcid: 0000-0003-1719-6815
According to our database1,
Seyed Nima Mozaffari
authored at least 10 papers
between 2015 and 2022.
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Bibliography
2022
On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST).
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, 2022
2019
An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test.
Proceedings of the IEEE International Test Conference, 2019
2018
IEEE Trans. Circuits Syst. I Regul. Pap., 2018
Proceedings of the 14th IEEE/ACM International Symposium on Nanoscale Architectures, 2018
2017
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017
Reducing power, area, and delay of threshold logic gates considering non-integer weights.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
2015
Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, 2015