Shaofeng Guo

According to our database, Shaofeng Guo authored at least 8 papers between 2017 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Circuit Reliability Comparison Between Stochastic Computing and Binary Computing.

Zuodong Zhang, Runsheng Wang, Zhe Zhang, Yawen Zhang, Shaofeng Guo, Ru Huang

IEEE Trans. Circuits Syst., 2020

2019

OMI/TMI-based Modeling and Fast Simulation of Random Telegraph Noise (RTN) in Advanced Logic Devices and Circuits.

Runsheng Wang, Zhe Zhang, Shaofeng Guo, Qingxue Wang, Dehuang Wu, Joddy Wang, Ru Huang

Proceedings of the 13th IEEE International Conference on ASIC, 2019

2018

Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.

Shaofeng Guo, Runsheng Wang, Pengpeng Ren, Changze Liu, Mulong Luo, Xiaobo Jiang, Yangyuan Wang, Ru Huang

Microelectron. Reliab., 2018

Evaluation of SRAM V_min shift induced by random telegraph noise (RTN): physical understanding and prediction method.

Shaofeng Guo, Zhenghan Lin, Runsheng Wang, Dongyuan Mao, Yangyuan Wang, Ru Huang

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

Investigation on the amplitude coupling effect of random telegraph noise (RTN) in nanoscale FinFETs.

Shaofeng Guo, Zhenghan Lin, Runsheng Wang, Zexuan Zhang, Zhe Zhang, Yangyuan Wang, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Layout-dependent aging mitigation for critical path timing.

Che-Lun Hsu, Shaofeng Guo, Yibo Lin, Xiaoqing Xu, Meng Li, Runsheng Wang, Ru Huang, David Z. Pan

Proceedings of the 23rd Asia and South Pacific Design Automation Conference, 2018

2017

Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator.

Shaofeng Guo, Runsheng Wang, Zhuoqing Yu, Peng Hao, Pengpeng Ren, Yangyuan Wang, Siyu Liao, Chunyi Huang, Tianlei Guo, Alvin Chen, Jushan Xie, Ru Huang

Proceedings of the 2017 IEEE/ACM International Conference on Computer-Aided Design, 2017

How close to the CMOS voltage scaling limit for FinFET technology? - Near-threshold computing and stochastic computing.

Runsheng Wang, Xiaobo Jiang, Shaofeng Guo, Ru Huang

Proceedings of the 12th IEEE International Conference on ASIC, 2017