Shohei Morishima

According to our database, Shohei Morishima authored at least 3 papers between 2005 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

Estimation of Delay Test Quality and Its Application to Test Generation.

Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo

IPSJ Trans. Syst. LSI Des. Methodol., 2008

2006

A Framework of High-quality Transition Fault ATPG for Scan Circuits.

Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Low-capture-power test generation for scan-based at-speed testing.

Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005