Stefan Weidling

According to our database1, Stefan Weidling authored at least 12 papers between 2013 and 2020.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

2020
Full Error Detection and Correction Method Applied on Pipelined Structure Using Two Approaches.
J. Circuits Syst. Comput., 2020

2019
The Impact of Diverse Execution Strategies on Incremental Code Updates for Wireless Sensor Networks.
Proceedings of the 8th International Conference on Sensor Networks, 2019

Selective Fault Tolerance by Counting Gates with Controlling Value.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2018
Power/Area-Optimized Fault Tolerance for Safety Critical Applications.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Heuristic for Page-Based Incremental Reprogramming of Wireless Sensor Nodes.
Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018

2017
Outdoor Range Measurements in Sub-GHz License-free Radio Bands under Realistic Conditions.
Proceedings of the 15th ACM International Symposium on Mobility Management and Wireless Access, 2017

2016
Neue Ansätze zur Verbesserung der Fehlertoleranz gegenüber transienten Fehlern in sequentiellen Schaltungen
PhD thesis, 2016

Enhanced architectures for soft error detection and correction in combinational and sequential circuits.
Microelectron. Reliab., 2016

2014
Fault tolerant linear state machines.
Proceedings of the 15th Latin American Test Workshop, 2014

Improved circuitry for soft error correction in combinational logic in pipelined designs.
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2013
Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection.
Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

A new method for correcting time and soft errors in combinational circuits.
Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013


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