Miquel Vellvehí

According to our database1, Miquel Vellvehí authored at least 22 papers between 2001 and 2017.

Collaborative distances :
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

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Bibliography

2017
Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs.
IEEE Trans. Industrial Electronics, 2017

2015
Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging.
IEEE Trans. Industrial Electronics, 2015

SiC Integrated Circuit Control Electronics for High-Temperature Operation.
IEEE Trans. Industrial Electronics, 2015

Characterization of phase change material systems using a thermal test device.
Microelectronics Journal, 2015

2014
Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications.
Microelectronics Reliability, 2014

Temperature effects on the ruggedness of SiC Schottky diodes under surge current.
Microelectronics Reliability, 2014

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.
Microelectronics Journal, 2014

Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing.
Proceedings of the 44th European Solid State Device Research Conference, 2014

2013
Thermal resistance investigations on new leadframe-based LED packages and boards.
Microelectronics Reliability, 2013

Design methodologies for reliability of SSL LED boards.
Microelectronics Reliability, 2013

4H-SiC MESFET specially designed and fabricated for high temperature integrated circuits.
Proceedings of the European Solid-State Device Research Conference, 2013

2012
Design for reliability of solid state lighting systems.
Microelectronics Reliability, 2012

Thermal cycling analysis of high temperature die-attach materials.
Microelectronics Reliability, 2012

DC temperature measurements for power gain monitoring in RF power amplifiers.
Proceedings of the 2012 IEEE International Test Conference, 2012

2011
Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems.
IEEE Trans. Industrial Electronics, 2011

SiC Schottky Diodes for Harsh Environment Space Applications.
IEEE Trans. Industrial Electronics, 2011

2007
Coupled electro-thermal simulation of a DC/DC converter.
Microelectronics Reliability, 2007

2004
Design considerations for 6.5 kV IGBT devices.
Microelectronics Journal, 2004

Self-heating experimental study of 600V PT-IGBTs under low dissipation energies.
Microelectronics Journal, 2004

IGBT gate driver IC with full-bridge output stage using a modified standard CMOS process.
Microelectronics Journal, 2004

2002
Reduction of self-heating effect on SOIM devices.
Microelectronics Reliability, 2002

2001
Smart Temperature Sensor for On-Line Monitoring in Automotive Applications.
Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001


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