Stephen Sunter

According to our database1, Stephen Sunter authored at least 16 papers between 2014 and 2021.

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Bibliography

2021
Automated Observability Analysis for Mixed-Signal Circuits.
Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2020
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs.
Proceedings of the IEEE International Test Conference, 2020

Analog Fault Simulation - a Hot Topic!
Proceedings of the IEEE European Test Symposium, 2020

2019
Efficient Analog Defect Simulation.
Proceedings of the IEEE International Test Conference, 2019

2018
IP session on ISO26262 EDA.
Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Measuring mixed-signal test stimulus quality.
Proceedings of the 23rd IEEE European Test Symposium, 2018

2017
A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods.
Proceedings of the IEEE International Test Conference, 2017

2016
Using Mixed-Signal Defect Simulation to Close the Loop Between Design and Test.
IEEE Trans. Circuits Syst. I Regul. Pap., 2016

Automated measurement of defect tolerance in mixed-signal ICs.
Proceedings of the 2016 IEEE International Test Conference, 2016

Closing the loop between analog design and test.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

Measuring defect tolerance within mixed-signal ICs.
Proceedings of the 21th IEEE European Test Symposium, 2016

2015
Special session: Hot topics: Statistical test methods.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2014
Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Efficient Monte Carlo-based analog parametric fault modelling.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Fast BIST of I/O Pin AC specifications and inter-chip delays.
Proceedings of the 2014 International Test Conference, 2014

Practical random sampling of potential defects for analog fault simulation.
Proceedings of the 2014 International Test Conference, 2014


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