Stewart E. Rauch

According to our database, Stewart E. Rauch authored at least 5 papers between 2007 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics.

Stewart E. Rauch, Dongho Lee, Alexey Vert, Lin Jiang, Byoung Min

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2020

Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics.

Stewart E. Rauch, Dongho Lee, Alexey Vert, Roy Gupta

Proceedings of the 29th IEEE North Atlantic Test Workshop, 2020

Self-heating characterization and its applications in technology development.

Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch, B. Min

Proceedings of the 29th IEEE North Atlantic Test Workshop, 2020

2016

A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs.

Prateek Sharma, Stanislav Tyaginov, Stewart E. Rauch, Jacopo Franco, Ben Kaczer, Alexander Makarov, Mikhail I. Vexler, Tibor Grasser

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2007

Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies.

Giuseppe La Rosa, Stewart E. Rauch III

Microelectron. Reliab., 2007