Maria Toledano-Luque

According to our database, Maria Toledano-Luque authored at least 9 papers between 2012 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area.

Maria Toledano-Luque, Peter C. Paliwoda, Mohamed Nour, Thomas Kauerauf, Byoung Min, Germain Bossu, Mahesh Siddabathula, Tanya Nigam

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Self-heating characterization and its applications in technology development.

Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch, B. Min

Proceedings of the 29th IEEE North Atlantic Test Workshop, 2020

2019

Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs.

M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, J. Johnson, P. Srinivasan, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2015

Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes.

Halil Kükner, Pieter Weckx, Sébastien Morrison, Jacopo Franco, Maria Toledano-Luque, Moonju Cho, Praveen Raghavan, Ben Kaczer, Doyoung Jang, Kenichi Miyaguchi, Marie Garcia Bardon, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken

Microprocess. Microsystems, 2015

Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs.

Alessio Spessot, Romain Ritzenthaler, Tom Schram, Marc Aoulaiche, Moonju Cho, Maria Toledano-Luque, Naoto Horiguchi, Pierre Fazan

Proceedings of the 2015 International Conference on IC Design & Technology, 2015

2014

Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations.

Baojun Tang, Weidong Zhang, Laurent Breuil, Colin Robinson, Yunqi Wang, Maria Toledano-Luque, Geert Van den Bosch, Jianfu Zhang, Jan Van Houdt

Microelectron. Reliab., 2014

As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability.

Baojun Tang, Kris Croes, Yohan Barbarin, Yunqi Wang, Robin Degraeve, Yunlong Li, Maria Toledano-Luque, Thomas Kauerauf, Jürgen Bömmels, Zsolt Tökei, Ingrid De Wolf

Microelectron. Reliab., 2014

2012

Defect-centric perspective of time-dependent BTI variability.

Maria Toledano-Luque, Ben Kaczer, Jacopo Franco, Philippe Roussel, Tibor Grasser, Guido Groeseneken

Microelectron. Reliab., 2012

Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.

Jacopo Franco, Ben Kaczer, Jérôme Mitard, Maria Toledano-Luque, Felice Crupi, Geert Eneman, Ph. J. Rousse, Tibor Grasser, M. Cho, Thomas Kauerauf, Liesbeth Witters, Geert Hellings, L.-Å. Ragnarsson, Naoto Horiguchi, Marc M. Heyns, Guido Groeseneken

Proceedings of the IEEE International Conference on IC Design & Technology, 2012