Giuseppe La Rosa

According to our database, Giuseppe La Rosa authored at least 7 papers between 2007 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Effectiveness of Computer-based e-Learning and Virtual Reality Training System for the Preparatory Phase of a Training on Maintenance Procedure.

Filippo Gabriele Pratticò, Debora Di Cosmo, Matteo Piviotti, Giuseppe La Rosa, Fabrizio Lamberti

Proceedings of the IEEE International Conference on Consumer Electronics, 2024

2019

Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery.

Elnatan Mataev, James H. Stathis, Giuseppe La Rosa, Barry P. Linder

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Process technology for IBM 14-nm processor designs featuring silicon-on-insulator FinFETs.

Scott R. Stiffler, Ravikumar Ramachandran, W. Kirklen Henson, Noah Zamdmer, Kevin McStay, Giuseppe La Rosa, Kevin M. Boyd, Sungjae Lee, Claude Ortolland, Paul C. Parries

IBM J. Res. Dev., 2018

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission.

Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications.

Chandrasekharan Kothandaraman, X. Chen, Dan Moy, D. Lea, Sami Rosenblatt, Faraz Khan, Derek Leu, Toshiaki Kirihata, D. Ioannou, Giuseppe La Rosa, J. B. Johnson, Norman Robson, Subramanian S. Iyer

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability.

Mukta G. Farooq, Giuseppe La Rosa, Fen Chen, Prakash Periasamy, Troy L. Graves-abe, Chandrasekharan Kothandaraman, C. Collins, W. Landers, J. Oakley, J. Liu, John Safran, S. Ghosh, S. Mittl, D. Ioannou, Carole Graas, Daniel Berger, Subramanian S. Iyer

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2007

Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies.

Giuseppe La Rosa, Stewart E. Rauch III

Microelectron. Reliab., 2007