Wen-Fa Wu

According to our database, Wen-Fa Wu authored at least 7 papers between 2010 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

3DIC with Stacked FinFET, Inter-Level Metal, and Field-Size (25×33mm²) Single-Crystalline Si on SiO2 by Elevated-Epi.

Bo-Jheng Shih, Yu-Ming Pan, Hao-Tung Chung, Chieh-Ling Lee, I-Chun Hsieh, Nein-Chih Lin, Chih-Chao Yang, Po-Tsang Huang, Hung-Ming Chen, Chiao-Yen Wang, Huan-Yu Chiu, Huang-Chung Cheng, Chang-Hong Shen, Wen-Fa Wu, Tuo-Hung Hou, Kuan-Neng Chen, Chenming Hu

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

Bit-Cost-Scalable 3D DRAM Architecture and Unit Cell First Demonstrated with Integrated Gate-Around and Channel-Around IGZO FETs.

Feng-Min Lee, Po-Hao Tseng, Yu-Yu Lin, Yu-Hsuan Lin, Wei-Lun Weng, Nei-Chih Lin, Po-Jung Sung, Chien-Ting Wu, Chih-Chao Yang, Wen-Fa Wu, Chang-Hong Shen, Tuo-Hung Hou, Ming-Hsiu Lee, Kuang-Yeu Hsieh, Keh-Chung Wang, Chih-Yuan Lu

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2015

Reliability impacts of high-speed 3-bit/cell Schottky barrier nanowire charge-trapping memories.

Wei Chang, Chun-Hsing Shih, Yan-Xiang Luo, Wen-Fa Wu, Chen-Hsin Lien

Microelectron. Reliab., 2015

2011

Evaluating nanotribological behavior of annealing Si_0.8Ge_0.2/Si films.

Ming-Jhang Wu, Hua-Chiang Wen, Shyh-Chi Wu, Ping-Feng Yang, Yi-Shao Lai, Wen-Kuang Hsu, Wen-Fa Wu, Chang-Pin Chou

Microelectron. Reliab., 2011

2010

Effect of annealing treatment and nanomechanical properties for multilayer Si_0.8Ge_0.2-Si films.

Bo-Ching He, Hua-Chiang Wen, Meng-Hung Lin, Yi-Shao Lai, Wen-Fa Wu, Chang-Pin Chou

Microelectron. Reliab., 2010

Evaluation of the nanoindentation behaviors of SiGe epitaxial layer on Si substrate.

Bo-Ching He, Chun-Hu Cheng, Hua-Chiang Wen, Yi-Shao Lai, Ping-Feng Yang, Meng-Hung Lin, Wen-Fa Wu, Chang-Pin Chou

Microelectron. Reliab., 2010

Evaluating the abrasive wear of Zn_1-_xMn_xO heteroepitaxial layers using a nanoscratch technique.

Yu-Ming Chang, Hua-Chiang Wen, Chu-Shou Yang, Derming Lian, Chien-Huang Tsai, Jyh-Shyang Wang, Wen-Fa Wu, Chang-Pin Chou

Microelectron. Reliab., 2010