Xiaoxian Liu

Orcid: 0000-0001-7177-7640

According to our database1, Xiaoxian Liu authored at least 25 papers between 2013 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
A Resonant Magnetic Probe Capable of Simultaneously Measuring Two Orthogonal Magnetic-Field Components.
IEEE Trans. Circuits Syst. II Express Briefs, December, 2023

A Ka-band fourth-order SIW filter power divider with wide out-of-band suppression.
Microelectron. J., March, 2023

A Composite Probe Capable of Simultaneously Measuring Two Orthogonal Magnetic-Fields.
IEEE Trans. Circuits Syst. II Express Briefs, February, 2023

Substrate-Integrated Waveguide Band-Pass Filter and Diplexer With Controllable Transmission Zeros and Wide-Stopband.
IEEE Trans. Circuits Syst. II Express Briefs, February, 2023

Filtering SIW phase shifter based on through quartz vias technology.
Microelectron. J., 2023

2022
An effective method to suppress high-order modes of SIW filters with compact size.
Microelectron. J., 2022

2021
Area-Efficient Extended 3-D Inductor Based on TSV Technology for RF Applications.
IEEE Trans. Very Large Scale Integr. Syst., 2021

Design of compact LC lowpass filters based on coaxial through-silicon vias array.
Microelectron. J., 2021

2020
Voltage Reference With Linear-Temperature-Dependent Power Consumption.
IEEE Trans. Very Large Scale Integr. Syst., 2020

Voltage Comparator With 60% Faster Speed by Using Charge Pump.
IEEE Trans. Circuits Syst., 2020

Physics based scalable inductance model for three-dimensional solenoid inductors.
Microelectron. J., 2020

2019
Electromagnetic modeling and analysis of the tapered differential through glass vias.
Microelectron. J., 2019

Broadband inductance modeling of TXVs for 3D interconnection.
Microelectron. J., 2019

2018
Temperature-dependent characterizations on parasitic capacitance of tapered through silicon via (T-TSV).
IEICE Electron. Express, 2018

Inductance of Different Profiles of Through Glass Vias based on magnetic flux density.
Proceedings of the 2018 IEEE Asia Pacific Conference on Circuits and Systems, 2018

2014
Capacitance characterization of tapered through-silicon-via considering MOS effect.
Microelectron. J., 2014

Temperature properties of the parasitic resistance of through-silicon vias (TSVs) in high-frequency 3-D ICs.
IEICE Electron. Express, 2014

A multiscale region-based approach to automatic SAR image registration using CLPSO.
Proceedings of the 2014 IEEE Geoscience and Remote Sensing Symposium, 2014

2013
Thermo-mechanical performance of Cu and SiO<sub>2</sub> filled coaxial through-silicon-via (TSV).
IEICE Electron. Express, 2013

Analytical models for the thermal strain and stress induced by annular through-silicon-via (TSV).
IEICE Electron. Express, 2013

Reduction of signal reflection in high-frequency three-dimensional (3D) integration circuits.
IEICE Electron. Express, 2013

Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol 10 (2013) No 19 pp 20130588].
IEICE Electron. Express, 2013

The impact of trapping centers on AlGaN/GaN resonant tunneling diode.
IEICE Electron. Express, 2013

An Automatic Parallel-Stage Decoupled Software Pipelining Parallelization Algorithm Based on OpenMP.
Proceedings of the 12th IEEE International Conference on Trust, 2013

A Compile-Time Cost Model for Automatic OpenMP Decoupled Software Pipelining Parallelization.
Proceedings of the 14th ACIS International Conference on Software Engineering, 2013


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