Li-Ming Denq

According to our database¹, Li-Ming Denq authored at least 13 papers between 2003 and 2012.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of four.

Timeline

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In proceedings

Article

PhD thesis

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Links

On csauthors.net:

Bibliography

2012

3D-IC BISR for stacked memories using cross-die spares.

[BibT_eX]

[DOI]

Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 2012

2011

A Memory Built-In Self-Repair Scheme Based on Configurable Spares.

[BibT_eX]

[DOI]

Mincent Lee

Li-Ming Denq

Cheng-Wen Wu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

A low-cost wireless interface with no external antenna and crystal oscillator for cm-range contactless testing.

[BibT_eX]

[DOI]

Proceedings of the 48th Design Automation Conference, 2011

2010

SOC Test Architecture and Method for 3-D ICs.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

Economic Analysis of the HOY Wireless Test Methodology.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2010

2009

Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories.

[BibT_eX]

[DOI]

Li-Ming Denq

Yu-Tsao Hsing

Cheng-Wen Wu

IEEE Des. Test Comput., 2009

2008

Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

A prototype of a wireless-based test system.

[BibT_eX]

[DOI]

Proceedings of the 2007 IEEE International SOC Conference, 2007

A Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories.

[BibT_eX]

[DOI]

Li-Ming Denq

Cheng-Wen Wu

Proceedings of the 16th Asian Test Symposium, 2007

2006

An Enhanced SRAM BISR Design with Reduced Timing Penalty.

[BibT_eX]

[DOI]

Li-Ming Denq

Tzu-chiang Wang

Cheng-Wen Wu

Proceedings of the 15th Asian Test Symposium, 2006

2004

A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories.

[BibT_eX]

[DOI]

Proceedings of the 12th IEEE International Workshop on Memory Technology, 2004

An SOC Test Integration Platform and Its Industrial Realization.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories.

[BibT_eX]

[DOI]

Proceedings of the 11th IEEE International Workshop on Memory Technology, 2003

Li-Ming Denq

Timeline

Legend:

Links

On csauthors.net:

Bibliography

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