Ankita Patidar

According to our database, Ankita Patidar authored at least 7 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

A Novel Omnidirectional 3D Test Access Architecture for Advanced System-on-Wafer (SoW) Applications.

Hiroyuki Iwata, Sandeep Kumar Goel, Ankita Patidar, Fumiaki Takashima, Frank Lee

Proceedings of the IEEE International Test Conference, 2025

Scan Chain Diagnosis in Advanced Process Nodes: The Art of Balancing Resolution, Repairability, and Cost.

Sandeep Kumar Goel, Ankita Patidar, Yue Tian, Frank Lee

Proceedings of the IEEE International Test Conference, 2025

Leveraging UCIe Interface for Silicon Health & Reliabiilty of Chiplets in a 3D Stack.

Sandeep Kumar Goel, Ankita Patidar, Stanley John, Frank Lee, Min-Jer Wang, Daniel F. J. Yang, Yervant Zorian, Manish Arora, Firooz Massoudi, Shaan Awasthi, Stelios Balalis, Velmurugan Pathervellaichamy, Bharath Shankaranarayanan, Narasimhalu Raju, Gurgen Harutyunyan, Grigor Tshagharyan, Vahagn Hovakimyan, Arman Karagyozyan, Alvina Manucharyan

Proceedings of the IEEE International Test Conference, 2025

2024

Physical-Aware Interconnect Test for Multi-Die Systems Using 3Dblox Open Standard.

Sandeep Kumar Goel, Ankita Patidar, Moiz Khan, Frank Lee, Anshuman Chandra, Martin Keim, Naim Lemar, Jonathan Gaudet, Quoc Phan, Vidya Neerkundar

Proceedings of the IEEE International Test Conference, 2024

Handling Die-to-Die I/O Pads for 3DIC Interconnect Tests.

Sandeep Kumar Goel, Moiz Khan, Ankita Patidar, Frank Lee, Vuong Nguyen, Bharath Shankaranarayanan, Doo Kim, Manish Arora

Proceedings of the IEEE International Test Conference, 2024

Scan Design Using Unsupervised Machine Learning to Reduce Functional Timing and Area Impact.

Sandeep Kumar Goel, Ankita Patidar, Frank Lee

Proceedings of the IEEE European Test Symposium, 2024

2023

A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation.

Anshuman Chandra, Moiz Khan, Ankita Patidar, Fumiaki Takashima, Sandeep Kumar Goel, Bharath Shankaranarayanan, Vuong Nguyen, Vistrita Tyagi, Manish Arora

Proceedings of the IEEE International Test Conference, 2023