David Lehninger
According to our database1,
David Lehninger
authored at least 9 papers
between 2020 and 2023.
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Bibliography
2023
Proceedings of the IEEE International Memory Workshop, 2023
Ferroelectric HfO2/ZrO2 Superlattices with Improved Leakage at Bias and Temperature Stress.
Proceedings of the IEEE International Memory Workshop, 2023
Permittivity Characterization of Ferroelectric Thin-Film Hafnium Zirconium Oxide Varactors up to 170 GHz.
Proceedings of the Device Research Conference, 2023
2022
Memory Array Demonstration of fully integrated 1T-1C FeFET concept with separated ferroelectric MFM device in interconnect layer.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Integration of BEoL Compatible 1T1C FeFET Memory Into an Established CMOS Technology.
Proceedings of the IEEE International Memory Workshop, 2022
Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability.
Proceedings of the IEEE International Memory Workshop, 2022
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022
2020
Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020