Euncheol Lee

According to our database, Euncheol Lee authored at least 9 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Holistic approaches to memory solutions for the Autonomous Driving Era.

Daeyong Shim, Chunseok Jeong, Euncheol Lee, Junmo Kang, Seokcheol Yoon, Yongkee Kwon, Il Park, Hyun Ahn, Seonyong Cha, Jinkook Kim

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology.

Seongkyung Kim, Ukjin Jung, Seungjin Choo, Kihyun Choi, Tae-Jin Chung, Shin-Young Chung, Euncheol Lee, Juhun Park, Deokhan Bae, Myungyoon Um

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Chip to Package Interaction Risk Assessment of FCBGA Devices using FEA Simulation, Meta-Modeling and Multi-Objective Genetic Algorithm Optimization Technique.

Moon Soo Lee, Inhak Baick, Min Kim, Seo Hyun Kwon, Myeong Soo Yeo, Hwasung Rhee, Euncheol Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction.

Hai Jiang, Jinju Kim, Kihyun Choi, Hyewon Shim, Hyunchul Sagong, Junekyun Park, Hwasung Rhee, Euncheol Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET.

Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Youngin Park, Kiil Hong, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM.

Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology.

Heung-Kook Ko, Sena Park, Jihyun Ryu, Sung Ryul Kim, Giwon Lee, Dongjoon Lee, Sangwoo Pae, Euncheol Lee, Yongsun Ji, Hai Jiang, Taeyoung Jeong, Taiki Uemura, Dongkyun Kwon, Hyungrok Do, Hyungu Kahng, Yoon-Sang Cho, Jiyoon Lee, Seoung Bum Kim

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

CIS Band Noise Prediction Methodology Using Co-Simulation of Camera Module.

Euncheol Lee, Hyunsu Jun, Wonho Choi, Kihyun Kwon, Jihyung Lim, Seunghak Lee, Joonseo Yim

Proceedings of the Imaging Sensors and Systems 2020, 2020

2015

A classification of the literature on the planning of substitutable products.

Hojung Shin, Soohoon Park, Euncheol Lee, W. C. Benton

Eur. J. Oper. Res., 2015