Jeongmin Jo

According to our database, Jeongmin Jo authored at least 9 papers between 2013 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Read It Now, Not Later! Integrating Semantic Recommendation into In-Browser Web Page Scrap Tool.

Jeongmin Jo, Sangyeon Kim, Sangwon Lee

Proceedings of the Extended Abstracts of the 2023 CHI Conference on Human Factors in Computing Systems, 2023

2022

A Preliminary Study of Multimodal Feedback Interfaces in Takeover Transition of Semi-Autonomous Vehicles.

Jeonguk Hong, Sangyeon Kim, Gyewon Jeon, Sanghyeok Boo, Jeongmin Jo, Jieun Park, Seoyoon Jung, Jiwon Park, Sangwon Lee

Proceedings of the AutomotiveUI '22: 14th International Conference on Automotive User Interfaces and Interactive Vehicular Applications - Adjunct Proceedings, Seoul, Republic of Korea, September 17, 2022

2021

Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology.

Taiki Uemura, Byungjin Chung, Jeongmin Jo, Mijoung Kim, Dalhee Lee, Gunrae Kim, Seungbae Lee, Taesjoong Song, Hwasung Rhee, Brandon Lee, Jaehee Choi

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

A Position Estimator Using Kalman Filter With a Data Rejection Filter for a Long-Stator Linear Synchronous Motor of Maglev.

Jeongmin Jo, Seok Y. Lee, Kwangjoo Lee, Ye Jun Oh, Su Y. Choi, Chang-Young Lee, Kwansup Lee

IEEE Access, 2020

Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET.

Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Youngin Park, Kiil Hong, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM.

Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Reliability of Industrial grade Embedded-STT-MRAM.

Yongsung Ji, Hyunjae Goo, Jungman Lim, Tae-Young Jeong, Taiki Uemura, Gun Rae Kim, Boil Seo, Seungbae Lee, Goeun Park, Jeongmin Jo, Sang-Il Han, Kilho Lee, Junghyuk Lee, Sohee Hwang, Daesop Lee, Suksoo Pyo, Hyun Taek Jung, Shinhee Han, Seungmo Noh, Kiseok Suh, Sungyoung Yoon, Hyeonwoo Nam, Hyewon Hwang, Hai Jiang, J. W. Kim, D. Kwon, Yoonjong Song, K. H. Koh, Hwasung Rhee, Sangwoo Pae, E. Lee

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Aging-Aware Design Verification Methods Under Real Product Operating Conditions.

Hyewon Shim, Jeongmin Jo, Yoohwan Kim, Bongyong Jeong, Minji Shon, Hai Jiang, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2013

Position Detection Performance Improvement for LSM Control in Super Speed Maglev.

Jinho Lee, Jeongmin Jo, Youngjae Han, Changyoung Lee

Proceedings of the Intelligent Robotics and Applications - 6th International Conference, 2013