Jinju Kim

Orcid: 0000-0002-1461-3727

According to our database1, Jinju Kim authored at least 12 papers between 2018 and 2026.

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Bibliography

2026
Happiness is Sharing a Vocabulary: A Study of Transliteration Methods.
Proceedings of the 19th Conference of the European Chapter of the Association for Computational Linguistics, 2026

2025
No Encore: Unlearning as Opt-Out in Music Generation.
CoRR, September, 2025

Do Not Mimic My Voice : Speaker Identity Unlearning for Zero-Shot Text-to-Speech.
Proceedings of the Forty-second International Conference on Machine Learning, 2025

2023
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Exploring the Feminization of Backseat Gaming Through <i>Girlfriend Reviews</i> YouTube Channel.
Games Cult., 2022

Do ICT Competence in and ICT Service Use Affect Life Satisfaction? Focusing on Mobile ICT Services.
Proceedings of the HCI International 2022 - Late Breaking Posters, 2022

2021
ICT-based person-centered community care platform (IPC3P) to enhance shared decision-making for integrated health and social care services.
Int. J. Medical Informatics, 2021

Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Investigation of BTI characteristics and its behavior on 10 nm SRAM with high-k/metal gate FinFET technology having multi-V<sub>T</sub> gate stack.
Microelectron. Reliab., 2018

A systematic study of gate dielectric TDDB in FinFET technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018


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