Jaehee Choi

According to our database1, Jaehee Choi authored at least 7 papers between 2020 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2024
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2022
Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020


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