Gyusung Park

According to our database, Gyusung Park authored at least 8 papers between 2018 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2026

0.021-μm² High-Density SRAM in Intel 18A RibbonFET Technology With PowerVia Backside Power Delivery.

Xiaofei Wang, Gwanghyeon Baek, Kunal Girish Bannore, Kaushal Dave, Arash Joushaghani, Minwoo Ko, Anandkumar Mahadevan Pillai, Hema Chandra Prakash Movva, Gyusung Park, Seenivasan Subramaniam, Teng Yang, Zheng Guo, Fatih Hamzaoglu, Eric A. Karl

IEEE J. Solid State Circuits, January, 2026

2025

29.2 A 0.021µm² High-Density SRAM in Intel-18A-RibbonFET Technology with PowerVia-Backside Power Delivery.

Xiaofei Wang, Yusung Kim, Gwanghyeon Baek, Kunal Girish Bannore, Kaushal Dave, Arash Joushaghani, Narae Kang, Minwoo Ko, Anandkumar Mahadevan Pillai, Hema Chandra Prakash Movva, Gyusung Park, Muktadir Rahman, Seenivasan Subramaniam, Vinay Vashishtha, Teng Yang, Zheng Guo, Eric A. Karl

Proceedings of the IEEE International Solid-State Circuits Conference, 2025

2024

15.2 A 2048x60m4 SRAM Design in Intel 4 with an Around-the-Array Power-Delivery Scheme Using PowerVia.

Daeyeon Kim, Yusung Kim, Ayush Shrivastava, Gyusung Park, Anandkumar Mahadevan Pillai, Kunal Bannore, Tri Doan, Muktadir Rahman, Gwanghyeon Baek, Clifford Ong, Xiaofei Wang, Zheng Guo, Eric Karl

Proceedings of the IEEE International Solid-State Circuits Conference, 2024

2021

An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array.

Gyusung Park, Hanzhao Yu, Minsu Kim, Chris H. Kim

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers.

Hanzhao Yu, Gyusung Park, Chris H. Kim

Proceedings of the 47th ESSCIRC 2021, 2021

2019

Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process.

Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy

Proceedings of the IEEE International Reliability Physics Symposium, 2019

A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing.

Gyusung Park, Minsu Kim, Nakul Pande, Po-Wei Chiu, Jeehwan Song, Chris H. Kim

Proceedings of the IEEE Custom Integrated Circuits Conference, 2019

2018

All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits.

Gyusung Park, Minsu Kim, Chris H. Kim, Bongjin Kim, Vijay Reddy

Proceedings of the IEEE International Reliability Physics Symposium, 2018