Georgios Tsiligiannis

According to our database, Georgios Tsiligiannis authored at least 10 papers between 2010 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning.

Georgios Tsiligiannis, Antoine D. Touboul, Gaëtan Bricas, Tadec Maraine, Jerome Boch, Frederic Wrobel, Alain Michez, Frédéric Saigné, Alain Godot, Asenath Etile, Thibaud Durand, Romain Sueur, Didier Farigoule, Philippe Girones

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems.

Lucas Matana Luza, Daniel Söderström, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2017

Analyzing the impact of radiation-induced failures in flash-based APSoC with and without fault tolerance techniques at CERN environment.

Lucas A. Tambara, Eduardo Chielle, Fernanda Lima Kastensmidt, Georgios Tsiligiannis, Salvatore Danzeca, Markus Brugger, A. Masi

Microelectron. Reliab., 2017

2013

Characterization of an SRAM based particle detector for mixed-field radiation environments.

Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné

Proceedings of the 5th IEEE International Workshop on Advances in Sensors and Interfaces, 2013

SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.

Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012

A Mixed Verification Strategy Tailored for Networks on Chip.

Georgios Tsiligiannis, Laurence Pierre

Proceedings of the 2012 Sixth IEEE/ACM International Symposium on Networks-on-Chip (NoCS), 2012

Evaluation of test algorithms stress effect on SRAMs under neutron radiation.

Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

2010

Compositional Translation of Simulink Models into Synchronous BIP.

Vassiliki Sfyrla, Georgios Tsiligiannis, Iris Safaka, Marius Bozga, Joseph Sifakis

Proceedings of the IEEE Fifth International Symposium on Industrial Embedded Systems, 2010

A very high resolution DAC at 1kHz for space applications.

George Tsiligiannis, Kostas Makris, Tasos Lambaounas, Dimosthenis Fragopoulos, Panagiotis Anagnostopoulos, Constantin Papadas, Jean-Pierre Schoellkopf, Boris Glass

Proceedings of the 2010 NASA/ESA Conference on Adaptive Hardware and Systems, 2010