Joel Damiens

According to our database, Joel Damiens authored at least 6 papers between 2013 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2025

A Programmable, Negative, and Dynamically Biased Sampler for Ultra-Low Power Body-Bias Generators in 18nm FD-SOI.

Tom Bergmann, Joel Damiens, Alfonso Hildebrand Rueda, Stephane Lacouture, Remy Cellier, Nacer Abouchi

Proceedings of the 40th Conference on Design of Circuits and Integrated Systems, 2025

2016

Clock generator behavioral modeling for supply voltage glitch attack effects analysis.

Noemie Beringuier-Boher, Vincent Beroulle, David Hély, Joel Damiens, Philippe Candelier

Microprocess. Microsystems, 2016

2014

Laser-induced fault effects in security-dedicated circuits.

Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

Laser attacks on integrated circuits: From CMOS to FD-SOI.

Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale

Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

Voltage Glitch Attacks on Mixed-Signal Systems.

Noemie Beringuier-Boher, Kamil Gomina, David Hély, Jean-Baptiste Rigaud, Vincent Beroulle, Assia Tria, Joel Damiens, Philippe Gendrier, Philippe Candelier

Proceedings of the 17th Euromicro Conference on Digital System Design, 2014

2013

Increasing the security level of analog IPs by using a dedicated vulnerability analysis methodology.

Noemie Beringuier-Boher, David Hély, Vincent Beroulle, Joel Damiens, Philippe Candelier

Proceedings of the International Symposium on Quality Electronic Design, 2013