Pierre Vanhauwaert

According to our database, Pierre Vanhauwaert authored at least 14 papers between 2005 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2018

Using multifunctional standardized stack as universal spintronic technology for IoT.

Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frederic Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, A. Atitoaie, I. Firastrau, Gregory di Pendina, Guillaume Prenat

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTack.

Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Pascal Nouet, Rui Ma, Martin Kreißig, Frank Ellinger, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Guillaume Prenat

Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017

2016

Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing.

Guillaume Prenat, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Nathalie Lamard, Olivier Boulle, Kevin Garello, Juergen Langer, Berthold Ocker, Marie Claire Cyrille, Pietro Gambardella, Mehdi Baradaran Tahoori, Gilles Gaudin

IEEE Trans. Multi Scale Comput. Syst., 2016

2014

Laser-induced fault effects in security-dedicated circuits.

Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

Laser-Induced Fault Effects in Security-Dedicated Circuits.

Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert

Proceedings of the VLSI-SoC: Internet of Things Foundations, 2014

IDSM: An improved disjoint signature monitoring scheme for processor behavioral checking.

Salma Bergaoui, Pierre Vanhauwaert, Régis Leveugle

Proceedings of the 15th Latin American Test Workshop, 2014

On error models for RTL security evaluations.

Pierre Vanhauwaert, Paolo Maistri, Régis Leveugle, Athanasios Papadimitriou, David Hély, Vincent Beroulle

Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

2009

Statistical fault injection: Quantified error and confidence.

Régis Leveugle, A. Calvez, Paolo Maistri, Pierre Vanhauwaert

Proceedings of the Design, Automation and Test in Europe, 2009

2008

Usefulness and effectiveness of HW and SW protection mechanisms in a processor-based system.

Pierre Vanhauwaert, Michele Portolan, Régis Leveugle, Philippe Roche

Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008

2007

A Novel Double-Data-Rate AES Architecture Resistant against Fault Injection.

Paolo Maistri, Pierre Vanhauwaert, Régis Leveugle

Proceedings of the Fourth International Workshop on Fault Diagnosis and Tolerance in Cryptography, 2007

Evaluation of Register-Level Protection Techniques for the Advanced Encryption Standard by Multi-Level Fault Injections.

Paolo Maistri, Pierre Vanhauwaert, Régis Leveugle

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

2006

Reduced Instrumentation and Optimized Fault Injection Control for Dependability Analysis.

Pierre Vanhauwaert, Régis Leveugle, Philippe Roche

Proceedings of the IFIP VLSI-SoC 2006, 2006

A Flexible SoPC-based Fault Injection Environment.

Pierre Vanhauwaert, Régis Leveugle, Philippe Roche

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

2005

Evaluation of SET and SEU Effects at Multiple Abstraction Levels.

Lorena Anghel, Régis Leveugle, Pierre Vanhauwaert

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005